cMOF Evidence Base
Diffraction Structure — Multilevel Chiral Semiconductor Metal-Peptide Framework Thin Film for Highly Circularly Polarized Visible Photodetection

Measurement evidence

Diffraction Structure

Multilevel Chiral Semiconductor Metal-Peptide Framework Thin Film for Highly Circularly Polarized Visible Photodetection · Zhang J.-B., Li N., Gu Z.-G. et al. · Journal of the American Chemical Society · 2025 · 26674-26683

2 measurement groups · 12 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Single-crystal X-ray diffraction

X-ray diffraction and scattering

Blue bulk CAS-4 crystals · Single Crystal

Ga Kalpha radiation, lambda = 1.54184 Angstrom; crystal data refined for CAS-4 at 100.00(10) K.

Temperature
100.00(10)
Context
Pristine bulk CAS-4 crystal.
Measurement source
SI p.12 · Results and Discussions · Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CCDC deposition number2383768——SI Table
Exact Reported		main p.8, article p.26681 · Accession Codes
Unit-cell a parameter14.6175(2) Angstrom—(2)SI Table
Exact Reported		SI p.12 · Table S1 · Table S1
Unit-cell c parameter26.1984(5) Angstrom—(5)SI Table
Exact Reported		SI p.12 · Table S1 · Table S1
Unit-cell volume5597.85(19) Angstrom^3—(19)SI Table
Exact Reported		SI p.12 · Table S1 · Table S1
Crystal systemtetragonal——SI Table
Exact Reported		SI p.12 · Table S1 · Table S1
Flack parameter0.023(11)—(11)SI Table
Exact Reported		SI p.12 · Table S1 · Table S1
CAS-4 empirical formula from crystal tableC28H44Cu2N12O8——SI Table
Exact Reported		SI p.12 · Table S1 · Table S1
Solvent-accessible pore network3D network structure with substantial solvent-accessible pores——Text
Qualitative		main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 1g
Space groupP41212——SI Table
Exact Reported		SI p.12 · Table S1 · Table S1

Out-of-plane XRD, in-plane XRD and GIWAXS

X-ray diffraction and scattering

Highly oriented CAS-4 thin film grown for 20 LPE-LBL cycles · Thin Film

Out-of-plane and in-plane XRD patterns for CAS-4 thin film grown over 20 cycles; GIWAXS used to identify lattice and film orientation.

Geometry
Oriented thin film.
Context
Pristine oriented CAS-4 thin film.
Measurement source
main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 2b-d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Preferred film orientation[101]-preferred orientation——Text
Qualitative		main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 2c,d
In-plane XRD peak positions6.82, 9.04, 10.73, 13.68, 16.85 and 21.41 degrees 2theta assigned to (101), (111), (112), (202), (213) and (313)——Text
Rounded Reported		main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 2b
Out-of-plane XRD peak positions6.82, 13.68 and 20.56 degrees 2theta assigned to (101), (202) and (303)——Text
Rounded Reported		main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 2b