Spectroscopy

UV-vis absorption spectroscopy during layer-by-layer growth

Highly oriented CAS-4 thin film grown for 20 LPE-LBL cycles · Thin Film

CAS-4 thin film on quartz substrate; bare quartz used as baseline; growth monitored by UV-vis absorption.

Geometry: Thin film.
Context: Pristine oriented CAS-4 thin film.
Measurement source: main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 2a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
CD signal at 600 nm	50 mdeg	—	—	Text Rounded Reported	main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 3b
Optical anisotropy factor gCD at 600 nm	approximately 0.01	—	—	Text Approximate	main p.4, article p.26677 · Synthesis and Sample Characterization · Figure 3b
Experimental optical band gap from Tauc plotMarked as a best value within this paper	1.40 eV	—	—	Text Rounded Reported	main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 3a

Highly oriented CAS-4 thin film grown for 20 LPE-LBL cycles · Thin Film

Full scan, N 1s and Cu 2p3/2 XPS spectra for CAS-4 thin film.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu 2p3/2 binding energy for Cu2+	933.7 eV	—	—	Text Rounded Reported	SI p.18 · Results and Discussions · Figure S10c
N 1s peak assigned to =N-	398.7 eV	—	—	Text Rounded Reported	SI p.18 · Results and Discussions · Figure S10b
N 1s peak assigned to N-H	399.6 eV	—	—	Text Rounded Reported	SI p.18 · Results and Discussions · Figure S10b