Microscopy Morphology — Multilevel Chiral Semiconductor Metal-Peptide Framework Thin Film for Highly Circularly Polarized Visible Photodetection

Measurement evidence

Microscopy Morphology

Multilevel Chiral Semiconductor Metal-Peptide Framework Thin Film for Highly Circularly Polarized Visible Photodetection · Zhang J.-B., Li N., Gu Z.-G. et al. · Journal of the American Chemical Society · 2025 · 26674-26683

1 measurement group · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM and AFM

Scanning electron microscopy Atomic force microscopy

Highly oriented CAS-4 thin film grown for 20 LPE-LBL cycles · Thin Film

Surface/cross-sectional SEM and AFM for oriented CAS-4 films; supplementary SEM for 5, 10 and 15 cycles.

Geometry: Thin film.
Context: Pristine oriented CAS-4 thin film.
Measurement source: main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 2e,f; Figures S2 and S8

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Average surface roughness	approximately 2 nm	—	—	Text Approximate	main p.3, article p.26676 · Synthesis and Sample Characterization · Figure S8
Film thickness after 10 cycles	230 nm	—	—	Figure Axis Rounded Reported	SI p.14 · Results and Discussions · Figure S2e
Film thickness after 15 cycles	340 nm	—	—	Figure Axis Rounded Reported	SI p.14 · Results and Discussions · Figure S2f
Film thickness after 20 cycles	approximately 480 nm	—	—	Text Approximate	main p.3, article p.26676 · Synthesis and Sample Characterization · Figure 2f
Film thickness after 5 cycles	130 nm	—	—	Figure Axis Rounded Reported	SI p.14 · Results and Discussions · Figure S2d