X-ray powder diffraction pattern matching
UiO-66(Zr)-(CO2D)2 characterisation powder · Powder
Bruker D8 Advance, Cu Kalpha1 radiation, Debye-Scherrer geometry; Topas indexing and pattern matching.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| lattice parameter a | a = 20.698(1) angstrom | — | (1) | Caption Exact Reported | 2 · X-Ray Powder Diffraction · Figure S1 |
| PXRD pattern-matching Rwp | Rwp = 2.301 | — | — | Caption Exact Reported | 2 · X-Ray Powder Diffraction · Figure S1 |
| space group | P23 | — | — | Caption Exact Reported | 2 · X-Ray Powder Diffraction · Figure S1 |
| unit-cell volume | V = 8868.3(1) angstrom^3 | — | (1) | Caption Exact Reported | 2 · X-Ray Powder Diffraction · Figure S1 |