Diffraction Structure — Oxidative control over the morphology of Cu3(HHTP)2, a 2D conductive metal-organic framework

Measurement evidence

Diffraction Structure

Oxidative control over the morphology of Cu3(HHTP)2, a 2D conductive metal-organic framework · Snook K.M., Zasada L.B., Chehada D. et al. · Chemical Science · 2022 · 10472-10478

6 measurement groups · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction

Cu3(HHTP)2 air-synthesis particles · Powder

Dropcast acetone suspensions onto silicon wafers and slowly evaporated.

Atmosphere
air after washing
Context
framework/control powder
Measurement source
S2; S22-S23 · General Materials and Methods; Supplementary Figures · Figures 4a, S7, S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource

Powder X-ray diffraction

Cu3(HHTP)2 air-synthesis rods · Powder

Dropcast acetone suspensions onto silicon wafers and slowly evaporated.

Atmosphere
air after washing
Context
framework/control powder
Measurement source
S2; S22-S23 · General Materials and Methods; Supplementary Figures · Figures 4a, S7, S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource

Powder X-ray diffraction

Cu3(HHTP)2 blocks, 0.3 equiv 2,5-dichloro pre-oxidant · Powder

Dropcast acetone suspensions onto silicon wafers and slowly evaporated.

Atmosphere
air after washing
Context
framework/control powder
Measurement source
S2; S22-S23 · General Materials and Methods; Supplementary Figures · Figures 4a, S7, S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase assignmentmatches expected Cu3(HHTP)2Qualitative
Qualitative
p005 / article p.10476 · Results and discussion · Figure 4a

Powder X-ray diffraction

Cu3(HHTP)2 flakes, 0.5 equiv 2,5-dichloro pre-oxidant · Powder

Dropcast acetone suspensions onto silicon wafers and slowly evaporated.

Atmosphere
air after washing
Context
framework/control powder
Measurement source
S2; S22-S23 · General Materials and Methods; Supplementary Figures · Figures 4a, S7, S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase assignmentmatches expected Cu3(HHTP)2Qualitative
Qualitative
p005 / article p.10476 · Results and discussion · Figure 4a

Powder X-ray diffraction

No-oxidant Cu/HHTP mixed-phase control · Powder

Dropcast acetone suspensions onto silicon wafers and slowly evaporated.

Atmosphere
air after washing
Context
framework/control powder
Measurement source
S2; S22-S23 · General Materials and Methods; Supplementary Figures · Figures 4a, S7, S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase assignmentCu3(HHTP)2 plus Cu2O plus unidentified secondary phaseQualitative
Qualitative
S22 · Supplementary Figures · Figure S7

Powder X-ray diffraction

Cu3(HHTP)2 rods, 0 equiv pre-oxidant · Powder

Dropcast acetone suspensions onto silicon wafers and slowly evaporated.

Atmosphere
air after washing
Context
framework/control powder
Measurement source
S2; S22-S23 · General Materials and Methods; Supplementary Figures · Figures 4a, S7, S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase assignmentmatches expected Cu3(HHTP)2Qualitative
Qualitative
p005 / article p.10476 · Results and discussion · Figure 4a