Microscopy Morphology — A highly oriented conductive MOF thin film-based Schottky diode for self-powered light and gas detection

3 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu3(C18H6(NH)6)2-20 nm thin film on functionalised n-Si · Thin Film

Cycle-dependent thickness and roughness for Cu3(C18H6(NH)6)2 films made by LBL spray.

Geometry: thin film on substrate
Context: pristine EC-MOF thin films
Measurement source: p002 / article p.9086 · Results and discussion · Fig. 2d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Fabricated Cu3(C18H6(NH)6)2 film thickness range	20-100 nm-thick films	—	—	Text Range	p005 / article p.9089 · Experimental - Preparation of Cu3(C18H6(NH)6)2 thin films
Thickness increase per deposition cycle	averagely increasing 2 nm per cycle	—	—	Text Rounded Reported	p002 / article p.9086 · Results and discussion · Fig. 2d and S9

Cu3(C18H6(NH)6)2-20 nm thin film on functionalised n-Si · Thin Film

Top-view/cross-sectional HR-SEM and AFM of Cu3(C18H6(NH)6)2-20 nm film on Si; RMS roughness over 100 um2.

Geometry: thin film on Si substrate
Context: pristine EC-MOF thin film
Measurement source: p002 / article p.9086 · Results and discussion · Fig. 2a-d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Film morphology	homogeneous and continuous	—	—	Text Qualitative	p002 / article p.9086 · Results and discussion · Fig. 2a-b
RMS roughness of 20 nm Cu3(C18H6(NH)6)2 film	~3 nm over a 100 um2 area	—	—	Text Approximate	p002 / article p.9086 · Results and discussion · Fig. 2d

Cu3(C18H6(NH)6)2-x nm thin-film series (x = 40, 60, 80, 100) · Thin Film

Top-view HR-SEM with cross-sectional insets and AFM images for Cu3(C18H6(NH)6)2 films of 40, 60, 80, and 100 nm.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(C18H6(NH)6)2 SEM/AFM thickness series	40, 60, 80, and 100 nm	—	—	Caption Range	p007 · Figure captions · Fig. S7 and Fig. S8