Field-emission scanning electron microscopy
CP1 ground powder series · Powder
Philips XL 30 S-FEG; 300 uA electron beam; 10.0 kV; 10^-7 Pa; doped SiO2 surfaces cleaned by sonication and metallised with 10 nm Cr.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Grinding morphology change | FESEM shows unground polycrystals and 15 min ground granules/defects; grain size decreases. | — | — | Text Qualitative | main p.7 / article p.347 · Results and discussion · Fig. S22 |
| SEM scale bars | 2 um and 500 nm | — | — | Caption Rounded Reported | SI p.17 · S7 SEM Images · Fig. S22 |