2D grazing-incidence wide-angle X-ray scattering (GIWAXS)
Pristine Cu-BHT thin film · Thin Film
Synchrotron GIWAXS used to determine crystallographic reflection centres, interlayer distance, and face-on orientation.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Edge-on crystallite orientation fraction | 1.8% edge-on | — | — | Text Exact Reported | p004 · Results and Discussion · Figure 2f |
| Face-on crystallite orientation fractionMarked as a best value within this paper | 98.2% face-on; edge-on/face-on area ratio about 1:49 | — | — | Text Exact Reported | p004 · Results and Discussion · Figure 2f |
| GIWAXS interlayer distance | 3.23 A | — | — | Text Exact Reported | p003 · Results and Discussion · Figure 2d |
| GIWAXS qz reflection assigned to (001) | qz = 1.94 A-1 | — | — | Text Rounded Reported | p003 · Results and Discussion · Figure 2d |
| GIWAXS qz reflection assigned to (010) | qz = 0.63 A-1 | — | — | Text Rounded Reported | p003 · Results and Discussion · Figure 2d |
| GIWAXS qz reflection assigned to (100) | qz = 0.60 A-1 | — | — | Text Rounded Reported | p003 · Results and Discussion · Figure 2d |
| GIWAXS qz reflection assigned to (110) | qz = 0.96 A-1 | — | — | Text Rounded Reported | p003 · Results and Discussion · Figure 2d |
| GIWAXS qz reflection assigned to (200) | qz = 0.92 A-1 | — | — | Text Rounded Reported | p003 · Results and Discussion · Figure 2d |