Microscopy Morphology

AFM tapping mode and SEM

Pristine Cu-BHT thin film · Thin Film

AFM images of up-side and bottom-side surfaces; SEM images in SI corroborate surface morphology.

Atmosphere: ambient
Geometry: 5 um x 5 um AFM scan for reaction-time series
Context: pristine Cu-BHT film; surface orientation comparison
Measurement source: p002-p004 · Results and Discussion · Figures 1-3 / Figure S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Bottom-side interfacial areaMarked as a best value within this paper	25.26 um2	—	—	Text Exact Reported	p003 · Results and Discussion · Figure 1
Bottom-side film height	17.42 nm	—	—	Text Exact Reported	p003 · Results and Discussion · Figure 2b
Bottom-side surface roughness rqMarked as a best value within this paper	rq = 8.6 nm	—	—	Text Rounded Reported	p003 · Results and Discussion · Figure 1h
Controlled Cu-BHT film thickness	approx 17 nm; conclusion says 16-nm-thick	—	RSD 3.9% for six films	Text Approximate	p003 · Results and Discussion · Figure S6
Thickness reproducibility RSD	RSD = 3.9%	—	—	Text Exact Reported	p003 · Results and Discussion · Figure S6
Up-side interfacial area	25.04 um2	—	—	Text Exact Reported	p003 · Results and Discussion · Figure 1
Up-side film height	16.79 nm	—	—	Text Exact Reported	p003 · Results and Discussion · Figure 2b
Up-side surface roughness rq	rq = 0.9 nm	—	—	Text Rounded Reported	p002-p003 · Results and Discussion · Figure 1e

Pristine Cu-BHT thin film · Thin Film

TEM and HRTEM images of Cu-BHT films used to observe crystalline grains and lattice spacings.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HRTEM lattice spacing assigned to (002)	0.32 nm corresponding to (002)	—	—	Text Rounded Reported	p002 · Results and Discussion · Figure S1b
HRTEM lattice spacing assigned to (106)	0.28 nm corresponding to (106)	—	—	Text Rounded Reported	p002 · Results and Discussion · Figure S1b