cMOF Evidence Base
Diffraction Structure — Dirac-cone induced metallic conductivity in Cu3(HHTP)2: high-quality MOF thin films fabricated via ML-driven robotic synthesis

Measurement evidence

Diffraction Structure

Dirac-cone induced metallic conductivity in Cu3(HHTP)2: high-quality MOF thin films fabricated via ML-driven robotic synthesis · Scheiger C., Pohls J.F., Mostaghimi M. et al. · Materials Horizons · 2025 · 6189-6194

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Out-of-plane and in-plane X-ray diffraction

X-ray diffraction and scattering

Optimised Cu3(HHTP)2 SURMOF thin film · Thin Film

Out-of-plane Bruker D8 Advance, 25-31.5 deg 2theta; in-plane Bruker D8 Discover, 3-30 deg 2theta; Cu Kalpha radiation

Geometry
thin film on SiO2/Si
Context
pristine framework thin film
Measurement source
p005 / SI Experimental 2.1 · X-ray diffraction (XRD) · Fig. 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
SURMOF domain size from in-plane XRD FWHMaround 100 nm——Text
Approximate		p004 / 6192 · Results · Fig. 2
XRD phase identity and crystallinityin-plane and out-of-plane XRD match simulated Cu3(HHTP)2 diffractogram; exceptional structural quality after ML optimisation——Text
Qualitative		p003 / 6191 · Results · Fig. 2