Microscopy Morphology

SEM cross-section and tapping-mode AFM

Optimised Cu3(HHTP)2 SURMOF thin film · Thin Film

XL30 ESEM FEG at 10 kV; Jupiter AFM thickness measurements

Atmosphere: SEM high vacuum mode
Geometry: thin films on SiO2/Si and glass
Context: pristine framework thin film
Measurement source: p006 and p014 / SI Experimental 2.4; Fig. S9-S10 · Scanning Electron Microscopy · Figures S9 and S10

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AFM film thickness on glass	648 +/- 67 nm	—	+/- 67 nm	Caption Exact Reported	p014 / SI Fig. S10 · Figure captions · Figure S10
SEM cross-section film thickness on SiO2/Si	602 nm +/- 74 nm	—	+/- 74 nm	Caption Exact Reported	p014 / SI Fig. S9 · Figure captions · Figure S9