Microscopy Morphology — Modular conductive MOF-gated field-effect biosensor for sensitive discrimination on the small molecular scale

Measurement evidence

Microscopy Morphology

Modular conductive MOF-gated field-effect biosensor for sensitive discrimination on the small molecular scale · Keum C., Park S., Kim H. et al. · Chemical Engineering Journal · 2023 · 141079

5 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Atomic force microscopy image and height profile

HTP-Co sensor: Co3HHTP2 thin film-modified electrode · Electrode

Co3HHTP2 thin-film control.

Geometry
Thin film on extended gate
Context
pristine HTP-Co control
Measurement source
SI rendered p.19 · Supplementary Figures and Tables · Fig. S18
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Co3HHTP2 AFM thickness16.7 +/- 1.0 nm+/- 1.0 nmFigure Axis
Rounded Reported
SI rendered p.19 · Supplementary Figures and Tables · Fig. S18

Atomic force microscopy edge height profile

TCP sensor: Cu2TCPP thin film on SnO2/ITO extended gate, 10 growth cycles · Electrode

Cu2TCPP film with 10 growth cycles on SnO2/ITO.

Geometry
Thin-film extended-gate electrode
Context
pristine c-MOF thin film
Measurement source
SI rendered p.4 · Supplementary Figures and Tables · Fig. S3b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu2TCPP-10C AFM thickness48.5 +/- 10.7 nm+/- 10.7 nmFigure Axis
Rounded Reported
SI rendered p.4 · Supplementary Figures and Tables · Fig. S3b

Atomic force microscopy height profiles

Cu3HHTP2 thickness series on extended gate, 5/10/15/20 growth cycles · Electrode

Cu3HHTP2 films with 5, 15 and 20 growth cycles; thickness increases with cycle number.

Geometry
Thin-film extended-gate electrodes
Context
pristine c-MOF thickness series
Measurement source
SI rendered p.16; p.4 · Supplementary Figures and Tables · Figs. S15 and S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3HHTP2 thickness trend with growth cyclesthickness increases according to growing cycleQualitative
Qualitative
main p.6 · 3.3 c-MOF thin films as active sensing layer · Figs. S14-S16

Field-emission SEM and cross-section SEM

TCP sensor: Cu2TCPP thin film on SnO2/ITO extended gate, 10 growth cycles · Electrode

Cu2TCPP film after 10 growth cycles on SnO2/ITO.

Geometry
Thin-film extended-gate electrode
Context
pristine c-MOF thin film
Measurement source
main p.4 · 3.1 Characterization · Fig. 2d; Fig. S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu2TCPP film continuitycontinuous thin film; absence of large aggregationQualitative
Qualitative
main p.4 · 3.1 Characterization · Fig. 2d

Field-emission SEM and cross-section SEM

HTP sensor: Cu3HHTP2 thin film on SnO2/ITO extended gate, 10 growth cycles · Electrode

Cu3HHTP2 film after 10 growth cycles on SnO2/ITO.

Geometry
Thin-film extended-gate electrode
Context
pristine c-MOF thin film
Measurement source
main p.4 · 3.1 Characterization · Fig. 2c; Fig. S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3HHTP2 film continuitycontinuous thin film; absence of large aggregationQualitative
Qualitative
main p.4 · 3.1 Characterization · Fig. 2c