cMOF Evidence Base
Diffraction Structure — Modular conductive MOF-gated field-effect biosensor for sensitive discrimination on the small molecular scale

Measurement evidence

Diffraction Structure

Modular conductive MOF-gated field-effect biosensor for sensitive discrimination on the small molecular scale · Keum C., Park S., Kim H. et al. · Chemical Engineering Journal · 2023 · 141079

3 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

XRD, UV-vis and XPS characterisation of Co3HHTP2 control film

X-ray photoelectron spectroscopyUV-visible and optical absorption spectroscopyX-ray diffraction and scattering

HTP-Co sensor: Co3HHTP2 thin film-modified electrode · Electrode

Supplementary structural/spectroscopic confirmation of Co3HHTP2 thin film.

Geometry
Thin film on extended gate
Context
pristine HTP-Co control
Measurement source
SI text · Supplementary Figures and Tables · Fig. S19
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Co3HHTP2 ligand-to-metal charge-transfer absorption~630 nm——Caption
Approximate		SI text · Supplementary Figures and Tables · Fig. S19
Co3HHTP2 pi-pi* absorption~360 nm——Caption
Approximate		SI text · Supplementary Figures and Tables · Fig. S19
Co3HHTP2 Co oxidation state by XPSpresence of Co2+——Caption
Qualitative		SI text · Supplementary Figures and Tables · Fig. S19

In-plane grazing-incidence X-ray diffraction (GIXRD), Cu-Kalpha radiation

X-ray diffraction and scattering

Cu2TCPP thin film on SnO2/ITO for GIXRD, 20 growth cycles · Thin Film

Thin film fabricated by 20 layer-by-layer growth cycles.

Geometry
Thin film on SnO2/ITO substrate
Context
pristine c-MOF thin film
Measurement source
main p.4-5 · 3.1 Characterization · Fig. 2e
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu2TCPP GIXRD (110) peak2theta = 7.7 deg——Text
Exact Reported		main p.5 · 3.1 Characterization · Fig. 2e
Cu2TCPP GIXRD (320) peak2theta = 19.6 deg——Text
Exact Reported		main p.5 · 3.1 Characterization · Fig. 2e
Cu2TCPP GIXRD (330) peak2theta = 23.0 deg——Text
Exact Reported		main p.5 · 3.1 Characterization · Fig. 2e
Cu2TCPP GIXRD (400) peak2theta = 21.5 deg——Text
Exact Reported		main p.5 · 3.1 Characterization · Fig. 2e

In-plane grazing-incidence X-ray diffraction (GIXRD), Cu-Kalpha radiation

X-ray diffraction and scattering

Cu3HHTP2 thin film on SnO2/ITO for GIXRD, 20 growth cycles · Thin Film

Thin film fabricated by 20 layer-by-layer growth cycles.

Geometry
Thin film on SnO2/ITO substrate
Context
pristine c-MOF thin film
Measurement source
main p.4-5 · 3.1 Characterization · Fig. 2e
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3HHTP2 GIXRD (100) peak2theta = 4.7 deg——Text
Exact Reported		main p.5 · 3.1 Characterization · Fig. 2e
Cu3HHTP2 GIXRD (200) peak2theta = 9.5 deg——Text
Exact Reported		main p.5 · 3.1 Characterization · Fig. 2e
Cu3HHTP2 GIXRD (210) peak2theta = 12.6 deg——Text
Exact Reported		main p.5 · 3.1 Characterization · Fig. 2e