Microscopy Morphology — Experimental manifestation of redox-conductivity in metal-organic frameworks and its implication for semiconductor/insulator switching

3 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

UU-100(Co) thin film on FTO · Thin Film

SEM top and cross-section images plus thin-film XRD for UU-100(Co) on FTO.

Geometry: FTO-supported thin film
Context: Pristine UU-100(Co) thin film.
Measurement source: 23-24 · Characterization of the UU-100(Co) thin-film · Supplementary Figs. 26-28

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
UU-100(Co) space group	P4/mbm	—	—	Caption Exact Reported	6 · Figure 4 caption · Fig. 4d
UU-100(Co) film thicknessMarked as a best value within this paper	approximately 0.90 um average from Supplementary Fig. 27 inset table	900 nm	visual estimate from embedded image table	Visual Estimate Approximate	23 · Characterization of the UU-100(Co) thin-film · Supplementary Fig. 27
UU-100(Co) tetragonal a/b cell parameter	a = b = 27.3 A	—	—	Caption Exact Reported	6 · Figure 4 caption · Fig. 4d
UU-100(Co) tetragonal c cell parameter	c = 19.6 A	—	—	Caption Exact Reported	6 · Figure 4 caption · Fig. 4d

Zn(pyrazol-NDI) thin film on FTO · Thin Film

SEM top-view and cross-section images of FTO-supported Zn(pyrazol-NDI) thin film.

Geometry: FTO-supported thin film
Context: Pristine Zn(pyrazol-NDI) thin film.
Measurement source: 5 · Characterization of the pyrazol-NDI linker and Zn(pyrazol-NDI) thin-film · Supplementary Figs. 2-3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Zn(pyrazol-NDI) film morphology	compact and uniform thin-film growth on FTO	—	—	Caption Qualitative	5 · Characterization · Supplementary Fig. 2
Zn(pyrazol-NDI) thin-film thicknessMarked as a best value within this paper	~700 nm	0.7 um	—	Text Approximate	3 · MOF thin-film preparation and basic characterizations · Fig. 2c; Supplementary Fig. 3

Zr(dcphOH-NDI) thin film on FTO · Thin Film

SEM top and cross-section images plus thin-film XRD for Zr(dcphOH-NDI) on FTO.

Geometry: FTO-supported thin film
Context: Pristine Zr(dcphOH-NDI) thin film.
Measurement source: 17-18 · Characterization of the dcphOH-NDI linker and Zr(dcphOH-NDI) thin-film · Supplementary Figs. 18-20

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Zr(dcphOH-NDI) film thicknessMarked as a best value within this paper	approximately 0.98 um average from Supplementary Fig. 19 inset table	980 nm	visual estimate from embedded image table	Visual Estimate Approximate	17 · Characterization of the dcphOH-NDI linker and Zr(dcphOH-NDI) thin-film · Supplementary Fig. 19