Cross-sectional FE-SEM and stylus thickness profiler
CuI(1A2P) film on glass · Thin Film
CuI(1A2P) films on glass prepared from 0.13, 0.26, 0.35 and 0.50 M precursor solutions after heating to 150 deg C.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| CuI(1A2P) thickness at 0.13 M | approximately 45 nm from Fig. 5b | — | — | Figure Axis Approximate | 6 · 3.2 Fabrication of CuI film on glass substrate · Fig. 5b |
| CuI(1A2P) thickness at 0.26 M | approximately 60 nm from Fig. 5b | — | — | Figure Axis Approximate | 6 · 3.2 Fabrication of CuI film on glass substrate · Fig. 5b |
| CuI(1A2P) thickness at 0.35 M | 94 nm | — | — | Text Exact Reported | 7 · 3.5 Physical properties of CuI thin films · Supplementary Fig. S21 |
| CuI(1A2P) thickness at 0.50 M | approximately 138 nm from Fig. 5b | — | — | Figure Axis Approximate | 6 · 3.2 Fabrication of CuI film on glass substrate · Fig. 5b |
| CuI(1A2P) void-and-crack-free thickness thresholdMarked as a best value within this paper | >50 nm | — | — | Text Approximate | 1 · Abstract |