Diffraction Structure — Effects of intervalence charge transfer interaction between π-stacked mixed valent tetrathiafulvalene ligands on the electrical conductivity of 3D metal-organic frameworks

Measurement evidence

Diffraction Structure

Effects of intervalence charge transfer interaction between π-stacked mixed valent tetrathiafulvalene ligands on the electrical conductivity of 3D metal-organic frameworks · Zhang S., Panda D.K., Yadav A. et al. · Chemical Science · 2021 · 13379-13391

4 measurement groups · 24 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

single-crystal X-ray diffraction and PXRD

Cs-MOF 4 · Powder

SXRD structures and PXRD phase-purity checks; Table 1 structural descriptors; SI crystallographic tables/CIF.

Context
pristine framework
Measurement source
13380-13383 · Syntheses and crystal structures of MOFs · Table 1, Fig. 2; SI Tables S1-S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
angle between staggered TTF layers87Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
TTF central C-C bond length1.317Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
pi-pi stacking distance3.707Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
S···S distance3.774Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
PXRD phase purity/stabilityPXRD patterns matched simulated/as-synthesized framework after drying/air exposure/pellet where testedText
Qualitative
13382-13384 · Syntheses and crystal structures of MOFs · Fig. S2
space groupPna21SI Table
Exact Reported
S10 · Crystallographic data of MOFs · Table S1/S2

single-crystal X-ray diffraction and PXRD

K-MOF 2 · Powder

SXRD structures and PXRD phase-purity checks; Table 1 structural descriptors; SI crystallographic tables/CIF.

Context
pristine framework
Measurement source
13380-13383 · Syntheses and crystal structures of MOFs · Table 1, Fig. 2; SI Tables S1-S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
angle between staggered TTF layers65Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
TTF central C-C bond length1.347Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
pi-pi stacking distance3.673Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
S···S distance3.791Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
PXRD phase purity/stabilityPXRD patterns matched simulated/as-synthesized framework after drying/air exposure/pellet where testedText
Qualitative
13382-13384 · Syntheses and crystal structures of MOFs · Fig. S2
space groupP21/cSI Table
Exact Reported
S10 · Crystallographic data of MOFs · Table S1/S2

single-crystal X-ray diffraction and PXRD

Na-MOF 1-ox · Powder

SXRD structures and PXRD phase-purity checks; Table 1 structural descriptors; SI crystallographic tables/CIF.

Context
pristine framework
Measurement source
13380-13383 · Syntheses and crystal structures of MOFs · Table 1, Fig. 2; SI Tables S1-S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
angle between staggered TTF layers36Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
TTF central C-C bond length1.342Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
pi-pi stacking distance3.391Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
S···S distance3.729Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
PXRD phase purity/stabilityPXRD patterns matched simulated/as-synthesized framework after drying/air exposure/pellet where testedText
Qualitative
13382-13384 · Syntheses and crystal structures of MOFs · Fig. S2
space groupIbamSI Table
Exact Reported
S10 · Crystallographic data of MOFs · Table S1/S2

single-crystal X-ray diffraction and PXRD

Rb-MOF 3 · Powder

SXRD structures and PXRD phase-purity checks; Table 1 structural descriptors; SI crystallographic tables/CIF.

Context
pristine framework
Measurement source
13380-13383 · Syntheses and crystal structures of MOFs · Table 1, Fig. 2; SI Tables S1-S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
angle between staggered TTF layers64Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
TTF central C-C bond length1.33Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
pi-pi stacking distance3.666Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
S···S distance3.82Table
Exact Reported
13380 · Syntheses and crystal structures of MOFs · Table 1
PXRD phase purity/stabilityPXRD patterns matched simulated/as-synthesized framework after drying/air exposure/pellet where testedText
Qualitative
13382-13384 · Syntheses and crystal structures of MOFs · Fig. S2
space groupPbcnSI Table
Exact Reported
S10 · Crystallographic data of MOFs · Table S1/S2