single-crystal X-ray diffraction and PXRD
Cs-MOF 4 · Powder
SXRD structures and PXRD phase-purity checks; Table 1 structural descriptors; SI crystallographic tables/CIF.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| angle between staggered TTF layers | 87 | — | — | Table Exact Reported | 13380 · Syntheses and crystal structures of MOFs · Table 1 |
| TTF central C-C bond length | 1.317 | — | — | Table Exact Reported | 13380 · Syntheses and crystal structures of MOFs · Table 1 |
| pi-pi stacking distance | 3.707 | — | — | Table Exact Reported | 13380 · Syntheses and crystal structures of MOFs · Table 1 |
| S···S distance | 3.774 | — | — | Table Exact Reported | 13380 · Syntheses and crystal structures of MOFs · Table 1 |
| PXRD phase purity/stability | PXRD patterns matched simulated/as-synthesized framework after drying/air exposure/pellet where tested | — | — | Text Qualitative | 13382-13384 · Syntheses and crystal structures of MOFs · Fig. S2 |
| space group | Pna21 | — | — | SI Table Exact Reported | S10 · Crystallographic data of MOFs · Table S1/S2 |