Diffraction Structure — Fe–O–Zr in MOF for effective photo-Fenton Bisphenol A degradation: Boosting mechanism of electronic transmission

Measurement evidence

Diffraction Structure

Fe–O–Zr in MOF for effective photo-Fenton Bisphenol A degradation: Boosting mechanism of electronic transmission · Guan Z., Zhu S., Ding S. et al. · Chemosphere · 2022 · 134481

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction

X-ray diffraction and scattering

FeUiO-X series · Powder

Wide-angle XRD comparison of UiO-66 and FeUiO-X.

Geometry: powder
Context: Pristine UiO-66 control compared with Fe-doped UiO-X series.
Measurement source: 3 · 3.1 Morphologies and structures · Fig. 1a-b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
UiO-66 characteristic XRD peaks retained after Fe doping	7.38, 8.52, 14.84, 17.1, 22.26, 25.8, 30.79 and 40.95 degrees; all samples show eight characteristic peaks	—	—	Text Exact Reported	3 · 3.1 Morphologies and structures · Fig. 1a-b