AFM (Park XE-7) and SEM
chemically synthesized Ni3HHTP2 nanorods · Powder
AFM image area 3 x 3 um2; SEM used for nanorod average size.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| AFM scan area | 3 x 3 um2 | — | — | Text Exact Reported | 3 · 3.3 Surface morphology studies · Fig. 4a |
| AFM surface roughness | 32.21 nm | — | — | Text Exact Reported | 3 · 3.3 Surface morphology studies · Fig. 4a |
| SEM average nanorod size | 0.172 nm | — | — | Text Exact Reported | 3 · 3.3 Surface morphology studies · Fig. 4b |