Diffraction Structure — An optoelectronic synapse based on Cu-BHT MOF for multi-wavelength optical logic gates and neuromorphic vision system

Measurement evidence

Diffraction Structure

An optoelectronic synapse based on Cu-BHT MOF for multi-wavelength optical logic gates and neuromorphic vision system · Li Z., Zhang L., Chen Y. et al. · Applied Materials Today · 2025 · 102926

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction

X-ray diffraction and scattering

Cu-BHT powder for XRD comparison · Powder

XRD pattern of Cu-BHT powder compared with reported Cu-BHT.

Atmosphere: ambient ex situ
Geometry: powder
Context: pristine Cu-BHT powder
Measurement source: p002 / SI p2 · Supplementary figures · Fig. S2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
XRD phase assignment	consistent with reported Cu-BHT	—	—	Text Qualitative	p004 / 4 · Results and discussion · Fig. S2b