Spectroscopy — An optoelectronic synapse based on Cu-BHT MOF for multi-wavelength optical logic gates and neuromorphic vision system

Measurement evidence

Spectroscopy

An optoelectronic synapse based on Cu-BHT MOF for multi-wavelength optical logic gates and neuromorphic vision system · Li Z., Zhang L., Chen Y. et al. · Applied Materials Today · 2025 · 102926

3 measurement groups · 13 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

UV-visible truncation method and UPS with He I source

Cu-BHT thin film on ultra-white glass substrate · Thin Film

Band gap from absorption truncation; work function from secondary electron cutoff; valence-band edge from UPS.

Atmosphere
ambient ex situ
Geometry
thin film
Context
pristine Cu-BHT film
Measurement source
p004 / 4 · Results and discussion · Fig. 2d; Fig. S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Ag work function used for band alignment4.26 eV4.26 eVText
Exact Reported
p004 / 4 · Results and discussion · Fig. 2e
Optical band gapabout 2.14 eV2.14 eVText
Approximate
p004 / 4 · Results and discussion · Fig. S5a
Valence-band maximum to Fermi-level energy difference1.50 eV1.5 eVText
Exact Reported
p004 / 4 · Results and discussion · Fig. S5c
Semiconductor typen-type semiconductor propertiesText
Qualitative
p004 / 4 · Results and discussion · Fig. 2d
Work function4.62 eV4.62 eVText
Exact Reported
p004 / 4 · Results and discussion · Fig. S5b

UV-visible absorption spectroscopy

Cu-BHT thin film on ultra-white glass substrate · Thin Film

Absorption spectrum of Cu-BHT thin film.

Atmosphere
ambient ex situ
Geometry
thin film
Context
pristine Cu-BHT film
Measurement source
p002 / 2 · Characterization · Fig. 1c
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Strong absorption wavelength range300 nm to 600 nmText
Range
p002 / 2 · Results and discussion · Fig. 1c

X-ray photoelectron spectroscopy, Cu 2p and S 2p regions

Cu-BHT thin film on ultra-white glass substrate · Thin Film

High-resolution XPS deconvolution used to assign Cu oxidation states and S bonding environments.

Atmosphere
ambient ex situ
Geometry
thin film
Context
pristine Cu-BHT film
Measurement source
p003 / 3 · Results and discussion · Fig. 1d,e; Fig. S2a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu 2p1/2 Cu2+ binding energy953.3 eV953.3 eVText
Exact Reported
p002 / 2 · Results and discussion · Fig. 1d
Cu 2p1/2 Cu+ binding energy951.8 eV951.8 eVText
Exact Reported
p002 / 2 · Results and discussion · Fig. 1d
Cu 2p3/2 Cu2+ binding energy932.9 eV932.9 eVText
Exact Reported
p002 / 2 · Results and discussion · Fig. 1d
Cu 2p3/2 Cu+ binding energy932.1 eV932.1 eVText
Exact Reported
p002 / 2 · Results and discussion · Fig. 1d
Cu+/Cu2+ peak-area ratioapproximately 2:12 Cu+/Cu2+Text
Approximate
p002 / 2 · Results and discussion · Fig. 1d
S-C 2p3/2 binding energy162.0 eV162 eVText
Exact Reported
p003 / 3 · Results and discussion · Fig. 1e
S-Cu to S-C integrated peak-area ratioapproximately twice2 S-Cu/S-CText
Approximate
p003 / 3 · Results and discussion · Fig. 1e