Microscopy Morphology — An optoelectronic synapse based on Cu-BHT MOF for multi-wavelength optical logic gates and neuromorphic vision system

4 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-BHT thin film on ultra-white glass substrate · Thin Film

AFM surface roughness image over 5 um x 5 um area.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AFM roughness Ra/RMS as reported	6.887 nm	6.887 nm	—	Text Exact Reported	p002 / SI p2 · Supplementary figures · Fig. S1

Cu-BHT thin film on ultra-white glass substrate · Thin Film

Film-thickness measurement by step profiler.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Average Cu-BHT film thickness	about 450 nm	450 nm	—	Text Approximate	p004 / 4 · Results and discussion · Fig. S4b

Cu-BHT thin film on ultra-white glass substrate · Thin Film

Surface morphology and elemental mapping of Cu-BHT film on glass substrate.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
EDS elemental distribution	C, S and Cu uniformly distributed	—	—	Text Qualitative	p002 / 2 · Results and discussion · Fig. 1b
Film surface morphology	dense and smooth	—	—	Text Qualitative	p002 / 2 · Results and discussion · Fig. 1b

Cu-BHT thin film on ultra-white glass substrate · Thin Film

TEM/HRTEM imaging of Cu-BHT thin film and FFT of selected HRTEM region.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HRTEM interlayer spacing	0.536 nm (5.36 A)	0.536 nm	—	Text Exact Reported	p004 / 4 · Results and discussion · Fig. S3b
TEM morphology	large-area plate-like morphology	—	—	Text Qualitative	p004 / 4 · Results and discussion · Fig. S3a