Diffraction Structure — High-κ Samarium-Based Metal-Organic Framework for Gate Dielectric Applications

Measurement evidence

Diffraction Structure

High-κ Samarium-Based Metal-Organic Framework for Gate Dielectric Applications · Pathak A., Chiou G.R., Gade N.R. et al. · ACS Applied Materials and Interfaces · 2017 · 21872-21878

2 measurement groups · 21 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction using Siemens D-5000, Cu Kalpha radiation, 40 kV, 30 mA

compound 1 powder / bulk sample · Powder

Wavelength 1.5406 Angstrom; step size 0.004 deg; scan speed 0.15 s per step; simulated pattern from Mercury 1.4.1.

Context
pristine framework
Measurement source
p002-p003 / journal pages 21873-21874 · 2.1; 3.3 · Figure 2a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD agreement with simulated patterngood agreementText
Qualitative
p003 / journal page 21874 · 3.3. Powder X-ray Diffraction and Thermogravimetric Analysis · Figure 2a

Single-crystal X-ray diffraction; Bruker-Nonius Kappa CCD in main text and Bruker APEX-II CCD in CIF; Mo Kalpha radiation; SHELXL refinement

as-synthesised compound 1 crystals · Single Crystal

Crystallographic data and refinement parameters reported in SI Table S1 and CIF; structure measured/refined near 293 K.

Temperature
293
Geometry
single crystal, 0.12 x 0.10 x 0.06 mm3
Context
pristine framework
Measurement source
p002 / SI page S-2 · Table S1 · Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
unit cell aa = 6.6276(3) Angstrom(3)SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
unit cell bb = 10.1411(4) Angstrom(4)SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
unit cell cc = 13.4095(5) Angstrom(5)SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
unit cell volumeV = 901.27(6) Angstrom3(6)SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
hexagonal channel diagonal metal separation distances8.30 and 7.11 AngstromText
Exact Reported
p003 / journal page 21874 · 3.2. Crystal Structure
crystal systemOrthorhombicSI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
calculated crystal densityDcalc = 2.745 g/cm3SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
empirical formula from Table S1C6H6O9SmSI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
formula weight372.46SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
hydrogen-bond distances in channelsH51...O2 1.97 A; H52...O1 2.06 A; H61...O1 2.05 A; H62...O6 2.19 AText
Exact Reported
p003 / journal page 21874 · 3.2. Crystal Structure · Figure S3
R1 for I > 2 sigma(I)R1 = 0.0110SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
R(int)R(int) = 0.0307SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
Sm-O bond length range2.340-2.580 AngstromText
Range
p002 / journal page 21873 · 3.2. Crystal Structure · Figure 1
longest listed Sm-O distance in CIFSm1-O3 2.5796(14) Angstrom(14)Table
Exact Reported
CIF text · geom_bond loop
shortest Sm-O distance in CIFSm1-O1 2.336(2) Angstrom(2)Table
Exact Reported
CIF text · geom_bond loop
Sm(III)...Sm(III) separation across bhc bridges11.620-9.350 AngstromText
Range
p002 / journal page 21873 · 3.2. Crystal Structure
space groupPnmn / P n m nSI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
framework topology3D (4,8)-connected netText
Qualitative
p003 / journal page 21874 · 3.2. Crystal Structure · Figure S4
wR2 for I > 2 sigma(I)wR2 = 0.0263SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1
Z valueZ = 4SI Table
Exact Reported
p002 / SI page S-2 · Table S1 · Table S1