Microscopy Morphology — High-κ Samarium-Based Metal-Organic Framework for Gate Dielectric Applications

Measurement evidence

Microscopy Morphology

High-κ Samarium-Based Metal-Organic Framework for Gate Dielectric Applications · Pathak A., Chiou G.R., Gade N.R. et al. · ACS Applied Materials and Interfaces · 2017 · 21872-21878

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Optical microscopy and scanning-electron-microscopy energy-dispersive X-ray spectroscopy

Elemental microanalysis and mapping

compound 1 powder / bulk sample · Powder

SI Figure S5 optical image of crystals; SI Figure S9 EDX spectrum labelled Sm-MOF-1.

Context: pristine framework
Measurement source: p006-p008 / SI pages S-6 to S-8 · Figures S5 and S9 · Figure S5; Figure S9

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
EDX elemental signatures	C, O and Sm peaks visible in SI Figure S9	—	—	Visual Estimate Qualitative	p008 / SI page S-8 · Figure S9 · Figure S9