Diffraction Structure — Thermally Driven Resistive Switching in Solution-Processable Thin Films of Coordination Polymers

3 measurement groups · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Ag-TCNQ thin film on SAM/Au · Thin Film

Ag-TCNQ thin film measured at 300 K, 400 K and after cooling to 300 K

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
structural change during thermal switching	no reasonable change in XRD pattern up to 400 K and after cooling	—	—	Text Qualitative	5011 · Main text · Figure 4a

Cu-TCNQ thin film on SAM/Au · Thin Film

Cu-TCNQ thin-film XRD at 300 K and 370 K during switching-control experiment.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-TCNQ thin-film variable-temperature XRD change	no appreciable change in temperature-dependent XRD patterns	—	—	Text Qualitative	5013 · Main text · Figure S7 referenced

Ag-TCNQ thin film on SAM/Au · Thin Film

Patterns recorded from 0th to 10th LbL cycle to follow Cu-TCNQ to Ag-TCNQ conversion

Geometry: thin film on SAM/Au
Context: sacrificial conversion from Cu-TCNQ control film to Ag-TCNQ target film
Measurement source: 5009 · Main text · Figure 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ag-TCNQ phase-I PXRD peak (002)	10.25 degrees 2theta	—	—	Text Exact Reported	5009 · Main text · Figure 2b
Ag-TCNQ phase-I PXRD peak (004)	21.5 degrees 2theta	—	—	Text Exact Reported	5009 · Main text · Figure 2b
Ag-TCNQ phase-I PXRD peak (022)	14.5 degrees 2theta	—	—	Text Exact Reported	5009 · Main text · Figure 2b
Cu-TCNQ phase-I PXRD peak (002)	15.6 degrees 2theta	—	—	Text Exact Reported	5009 · Main text · Figure 2b
Cu-TCNQ phase-I PXRD peak (011)	11.0 degrees 2theta	—	—	Text Exact Reported	5009 · Main text · Figure 2b
Cu-TCNQ phase-I PXRD peak (012)	17.4 degrees 2theta	—	—	Text Exact Reported	5009 · Main text · Figure 2b