EDXS spectra and elemental mapping
Ag-TCNQ thin film on SAM/Au · Thin Film
Initial Cu-TCNQ film compared with final Ag-TCNQ film after step II
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ag L-alpha EDXS line in final Ag-TCNQ film | approximately 2.93 keV | — | — | Text Approximate | 5009 · Main text · Figure 2c |
| Ag L-beta EDXS line in final Ag-TCNQ film | approximately 3.15 keV | — | — | Text Approximate | 5009 · Main text · Figure 2c |
| Cu L-alpha EDXS line in initial Cu-TCNQ film | approximately 0.93 keV | — | — | Text Approximate | 5009 · Main text · Figure 2c |