XRD (Bruker D8 ADVANCE)
PVDF/UiO-66-NH2 NFM · Thin Film
UiO crystal structure characterised within 5-40 degree 2theta range
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| UiO XRD peak positions | 7.27, 8.37, 11.98, 16.98, 22.13, 25.62, 30.60 | — | — | Text Exact Reported | p004 / journal page 7325 · 3.1 Characterization of PVDF/UIO · Figure 3a |