Measurement evidence
Enhancing Proton Conductivity and Dimensional Stability of Nanofiber Proton Exchange Membranes through In Situ Growth of MOF-Modified PVDF Nanofibers · Sun J., Han D., Dong R. et al. · Energy and Fuels · 2024 · 7322-7330
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
A-PVDF-N@Nafion · Thin Film
surface and cross-sectional SEM of final NFPEM
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| A-PVDF-N@Nafion final membrane morphology | rough surface due to MOF loading; tight void filling without apparent defects | — | — | Text Qualitative | p005 / journal page 7326 · 3.2 Characterization of PVDF/UIO@Nafion · Figure 4 |
A-PVDF@Nafion · Thin Film
surface and cross-sectional SEM of final NFPEM
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| A-PVDF@Nafion final membrane morphology | smooth and flat surface; Nafion fills fiber voids tightly | — | — | Text Qualitative | p005 / journal page 7326 · 3.2 Characterization of PVDF/UIO@Nafion · Figure 4 |
ammoniated PVDF NFM · Thin Film
fiber surface morphology; scale bars 1 um and 500 nm
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| aminated PVDF morphology | rougher swollen surface; average diameter slightly increases | — | — | Text Qualitative | p004 / journal page 7325 · 3.1 Characterization of PVDF/UIO · Figure 2b |
A-PVDF-NS@Nafion · Thin Film
surface and cross-sectional SEM of final NFPEM
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| A-PVDF-NS@Nafion final membrane morphology | rough surface due to MOF loading; tight void filling without apparent defects | — | — | Text Qualitative | p005 / journal page 7326 · 3.2 Characterization of PVDF/UIO@Nafion · Figure 4 |
PVDF@Nafion · Thin Film
surface and cross-sectional SEM of final NFPEM
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PVDF@Nafion final membrane morphology | smooth and flat surface; Nafion fills fiber voids tightly | — | — | Text Qualitative | p005 / journal page 7326 · 3.2 Characterization of PVDF/UIO@Nafion · Figure 4 |
PVDF NFM · Thin Film
fiber surface morphology; scale bars 1 um and 500 nm
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PVDF fiber morphology | smooth surface with no adherence | — | — | Text Qualitative | p004 / journal page 7325 · 3.1 Characterization of PVDF/UIO · Figure 2a |
PVDF/UiO-66-NH2 NFM · Thin Film
fiber surface morphology; scale bars 1 um and 500 nm
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| UiO-66-NH2 loading morphology | dense growth with well defined crystalline structure and octahedral trend | — | — | Text Qualitative | p004 / journal page 7325 · 3.1 Characterization of PVDF/UIO · Figure 2c |
PVDF/UiO-66-NH2-SO3H NFM · Thin Film
fiber surface morphology; scale bars 1 um and 500 nm
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| UiO-66-NH2-SO3H loading morphology | observable loading but lower level than UiO-66-NH2 | — | — | Text Qualitative | p004 / journal page 7325 · 3.1 Characterization of PVDF/UIO · Figure 2d |