Diffraction Structure — Structure and Electrical Transport Properties of Metal Cate-Cholate Frameworks: The Metal Center Matters†

Measurement evidence

Diffraction Structure

Structure and Electrical Transport Properties of Metal Cate-Cholate Frameworks: The Metal Center Matters† · Yang M., Zhu R., Chen X. et al. · Chinese Journal of Chemistry · 2026 · 311-318

6 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction (PXRD)

Ca-HHTP powder sample · Powder

Rigaku sixth-generation MiniFlex; Cu Kalpha radiation, 600 W (40 kV, 15 mA); powder sample.

Context
pristine powder
Measurement source
SI p.S3 and S10 · Materials and Methods; Powder X-ray Diffraction · Figure 1a; Figure S5/S6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Ca-HHTP Pawley a=ba = b = 22.2 AText
Exact Reported
main p.2, article p.312 · Preparation and structural characterizations · Figure S5
Ca-HHTP Pawley cc = 13.3 AText
Exact Reported
main p.2, article p.312 · Preparation and structural characterizations · Figure S5
Ca-HHTP Pawley final RwpRwp = 5.47%Text
Exact Reported
main p.2, article p.312 · Preparation and structural characterizations · Figure S5

Powder X-ray diffraction (PXRD)

Co-HHTP powder sample · Powder

Rigaku sixth-generation MiniFlex; Cu Kalpha radiation, 600 W (40 kV, 15 mA); powder sample.

Context
pristine powder
Measurement source
SI p.S3 and S10 · Materials and Methods; Powder X-ray Diffraction · Figure 1a; Figure S5/S6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource

Powder X-ray diffraction (PXRD)

Cu-HHTP powder sample · Powder

Rigaku sixth-generation MiniFlex; Cu Kalpha radiation, 600 W (40 kV, 15 mA); powder sample.

Context
pristine powder
Measurement source
SI p.S3 and S10 · Materials and Methods; Powder X-ray Diffraction · Figure 1a; Figure S5/S6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource

Powder X-ray diffraction (PXRD)

Mg-HHTP powder sample · Powder

Rigaku sixth-generation MiniFlex; Cu Kalpha radiation, 600 W (40 kV, 15 mA); powder sample.

Context
pristine powder
Measurement source
SI p.S3 and S10 · Materials and Methods; Powder X-ray Diffraction · Figure 1a; Figure S5/S6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Common PXRD 100 reflection4.8 deg 2thetaText
Rounded Reported
main p.2-p.3, article p.312-p.313 · Preparation and structural characterizations · Figure 1; Figure S8
Common PXRD 200 reflection9.6 deg 2thetaText
Rounded Reported
main p.2-p.3, article p.312-p.313 · Preparation and structural characterizations · Figure 1; Figure S8
Common PXRD 210 reflection13.9 deg 2thetaText
Rounded Reported
main p.2-p.3, article p.312-p.313 · Preparation and structural characterizations · Figure 1; Figure S8

Powder X-ray diffraction (PXRD)

Ni-HHTP powder sample · Powder

Rigaku sixth-generation MiniFlex; Cu Kalpha radiation, 600 W (40 kV, 15 mA); powder sample.

Context
pristine powder
Measurement source
SI p.S3 and S10 · Materials and Methods; Powder X-ray Diffraction · Figure 1a; Figure S5/S6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource

Powder X-ray diffraction (PXRD)

Zn-HHTP powder sample · Powder

Rigaku sixth-generation MiniFlex; Cu Kalpha radiation, 600 W (40 kV, 15 mA); powder sample.

Context
pristine powder
Measurement source
SI p.S3 and S10 · Materials and Methods; Powder X-ray Diffraction · Figure 1a; Figure S5/S6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource