Measurement evidence
Structure and Electrical Transport Properties of Metal Cate-Cholate Frameworks: The Metal Center Matters† · Yang M., Zhu R., Chen X. et al. · Chinese Journal of Chemistry · 2026 · 311-318
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
Ca-HHTP film sample · Thin Film
Tapping-mode AFM on M-HHTP film on quartz glass substrate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ca-HHTP film thickness by AFM | 500 nm | 500 nm | — | Visual Estimate Approximate | SI p.S17 · Atomic Force Microscope · Figure S14 |
Ca-HHTP powder sample · Powder
JEM-2100 Plus, 200 kV; powders dispersed in ethanol, drop-cast on carbon-coated copper grid and dried ambient.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|
Ca-HHTP powder sample · Powder
Quanta FEG 250; 7 mm working distance, 10 kV beamline, 10^-6 torr chamber; sample on carbon conductive tape/aluminum plate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ca-HHTP SEM morphology | rod-like morphology; well-formed single crystals exceeding 20 um in length | — | — | Text Qualitative | main p.3, article p.313 · Preparation and structural characterizations · Figure 2; Figure S7 |
Co-HHTP film sample · Thin Film
Tapping-mode AFM on M-HHTP film on quartz glass substrate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Co-HHTP film thickness by AFM | 300 nm | 300 nm | — | Visual Estimate Approximate | SI p.S17 · Atomic Force Microscope · Figure S14 |
Co-HHTP powder sample · Powder
JEM-2100 Plus, 200 kV; powders dispersed in ethanol, drop-cast on carbon-coated copper grid and dried ambient.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|
Co-HHTP powder sample · Powder
Quanta FEG 250; 7 mm working distance, 10 kV beamline, 10^-6 torr chamber; sample on carbon conductive tape/aluminum plate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Co-HHTP SEM morphology | rod-like morphology; well-formed single crystals exceeding 20 um in length | — | — | Text Qualitative | main p.3, article p.313 · Preparation and structural characterizations · Figure 2; Figure S7 |
Cu-HHTP film sample · Thin Film
Tapping-mode AFM on M-HHTP film on quartz glass substrate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu-HHTP film thickness by AFM | 500 nm | 500 nm | — | Visual Estimate Approximate | SI p.S17 · Atomic Force Microscope · Figure S14 |
Cu-HHTP powder sample · Powder
JEM-2100 Plus, 200 kV; powders dispersed in ethanol, drop-cast on carbon-coated copper grid and dried ambient.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|
Cu-HHTP powder sample · Powder
Quanta FEG 250; 7 mm working distance, 10 kV beamline, 10^-6 torr chamber; sample on carbon conductive tape/aluminum plate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu-HHTP SEM morphology | rod-like morphology; well-formed single crystals exceeding 20 um in length | — | — | Text Qualitative | main p.3, article p.313 · Preparation and structural characterizations · Figure 2; Figure S7 |
Mg-HHTP film sample · Thin Film
Tapping-mode AFM on M-HHTP film on quartz glass substrate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Mg-HHTP film thickness by AFM | 3500 nm | 3500 nm | — | Visual Estimate Approximate | SI p.S17 · Atomic Force Microscope · Figure S14 |
Mg-HHTP powder sample · Powder
JEM-2100 Plus, 200 kV; powders dispersed in ethanol, drop-cast on carbon-coated copper grid and dried ambient.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HRTEM/FFT periodicity of (100) plane | 1.8 nm | — | — | Text Rounded Reported | main p.2-p.3, article p.312-p.313 · Preparation and structural characterizations · Figure 1; Figure S8 |
Mg-HHTP powder sample · Powder
Quanta FEG 250; 7 mm working distance, 10 kV beamline, 10^-6 torr chamber; sample on carbon conductive tape/aluminum plate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Mg-HHTP SEM morphology | rod-like morphology; well-formed single crystals exceeding 20 um in length | — | — | Text Qualitative | main p.3, article p.313 · Preparation and structural characterizations · Figure 2; Figure S7 |
Ni-HHTP film sample · Thin Film
Tapping-mode AFM on M-HHTP film on quartz glass substrate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni-HHTP film thickness by AFM | 150 nm | 150 nm | — | Visual Estimate Approximate | SI p.S17 · Atomic Force Microscope · Figure S14 |
Ni-HHTP powder sample · Powder
JEM-2100 Plus, 200 kV; powders dispersed in ethanol, drop-cast on carbon-coated copper grid and dried ambient.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|
Ni-HHTP powder sample · Powder
Quanta FEG 250; 7 mm working distance, 10 kV beamline, 10^-6 torr chamber; sample on carbon conductive tape/aluminum plate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni-HHTP SEM morphology | rod-like morphology; notably smaller grain sizes | — | — | Text Qualitative | main p.3, article p.313 · Preparation and structural characterizations · Figure 2; Figure S7 |
Zn-HHTP film sample · Thin Film
Tapping-mode AFM on M-HHTP film on quartz glass substrate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Zn-HHTP film thickness by AFM | 500 nm | 500 nm | — | Visual Estimate Approximate | SI p.S17 · Atomic Force Microscope · Figure S14 |
Zn-HHTP powder sample · Powder
JEM-2100 Plus, 200 kV; powders dispersed in ethanol, drop-cast on carbon-coated copper grid and dried ambient.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|
Zn-HHTP powder sample · Powder
Quanta FEG 250; 7 mm working distance, 10 kV beamline, 10^-6 torr chamber; sample on carbon conductive tape/aluminum plate.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Zn-HHTP SEM morphology | rod-like morphology; notably smaller grain sizes | — | — | Text Qualitative | main p.3, article p.313 · Preparation and structural characterizations · Figure 2; Figure S7 |