PXRD
Cu-TCPP nanosheets · Nanosheet
PANalytical Empyrean diffractometer with Cu-Kalpha radiation, lambda = 0.15405 nm; Cu-TCPP and Cu-THQ compared with literature patterns.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu-TCPP PXRD (004) peak | 19.5 deg assigned to (004) | — | — | Text Rounded Reported | 4 · Characterization of the synthesized 2D Cu-MOF nanosheets · Figure 1C |
| Cu-THQ PXRD (001) peak | 30.3 deg assigned to (001) | — | — | Text Rounded Reported | 4 · Characterization of the synthesized 2D Cu-MOF nanosheets · Figure 1D |
| Cu-THQ PXRD (100) peak | 7.7 deg assigned to (100) | — | — | Text Rounded Reported | 4 · Characterization of the synthesized 2D Cu-MOF nanosheets · Figure 1D |
| Cu-THQ PXRD (200) peak | 16.2 deg assigned to (200) | — | — | Text Rounded Reported | 4 · Characterization of the synthesized 2D Cu-MOF nanosheets · Figure 1D |