XPS
Cu-TCPP nanosheets · Nanosheet
XPS used to examine surface composition and valence states of Cu-TCPP and Cu-THQ.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu 2p XPS region for Cu-TCPP and Cu-THQ | Cu-TCPP and Cu-THQ exhibit two Cu2p peaks at approximately 932-934 eV and 931-933 eV, corresponding to Cu2p3/2 and Cu2p1/2 | — | — | Text Range | 4 · Characterization of the synthesized 2D Cu-MOF nanosheets · Figures S1-S2 |