Diffraction Structure — In-situ growth of high-crystallinity M3(hexaaminotriphenylene)2 (M = Co, Ni) thin film for field-effect transistor-based glucose biosensor

Measurement evidence

Diffraction Structure

In-situ growth of high-crystallinity M3(hexaaminotriphenylene)2 (M = Co, Ni) thin film for field-effect transistor-based glucose biosensor · Tan P., Shen S., Luo Y. et al. · Chinese Chemical Letters · 2026 · 111636

4 measurement groups · 15 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

X-ray diffraction (XRD-70003KW)

Co/Ni-HITP (DMF) thin film · Thin Film

Co/Ni-HITP synthesised in DMF/water mixed solvent

Geometry
thin film on device substrate
Context
pristine bimetallic MOF film
Measurement source
2 · Results · Fig. 1d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Co/Ni-HITP FWHM near 27.1 deg peakMarked as a best value within this paper1.2 degText
Exact Reported
2 · Results · Fig. 1d
Co/Ni-HITP FWHM near 4.8 deg peakMarked as a best value within this paper0.76 degText
Exact Reported
2 · Results · Fig. 1d
Co/Ni-HITP FWHM near 9.2 deg peak1.02 degText
Exact Reported
2 · Results · Fig. 1d

X-ray diffraction (XRD-70003KW)

Co/Ni-HITP (water) thin film · Thin Film

Co/Ni-HITP aqueous control

Geometry
thin film
Context
pristine bimetallic water-phase control
Measurement source
2 · Results · Fig. 1d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Co/Ni-HITP (water) characteristic XRD peakscharacteristic peaks at approximately 4.8 deg and 27.1 deg disappearText
Qualitative
2 · Results · Fig. 1d

X-ray diffraction (XRD-70003KW)

Ni-HITP (water) thin film · Thin Film

Ni-HITP aqueous control

Geometry
thin film
Context
pristine monometallic control
Measurement source
2 · Results · Fig. 1d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Ni-HITP FWHM at 27.1 deg1.8 degText
Exact Reported
2 · Results · Fig. 1d
Ni-HITP FWHM at 4.8 deg0.86 degText
Exact Reported
2 · Results · Fig. 1d
Ni-HITP FWHM at 9.2 deg0.88 degText
Exact Reported
2 · Results · Fig. 1d
Ni-HITP XRD peak position (001)27.1 degText
Rounded Reported
2 · Results · Fig. 1d
Ni-HITP XRD peak position (100)4.8 degText
Rounded Reported
2 · Results · Fig. 1d
Ni-HITP XRD peak position (200)9.2 degText
Rounded Reported
2 · Results · Fig. 1d

XRD and SEM comparison of Co-HITP films in DMF and aqueous solvent

Co-HITP film · Thin Film

SI control comparing Co-HITP prepared with DMF as solvent versus deionized water as solvent

Geometry
thin film/membrane control
Context
pristine monometallic Co-HITP controls
Measurement source
S-7 · Supporting information · Fig. S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Co-HITP (DMF) XRD peak position12.8 degFigure Axis
Rounded Reported
S-7 · Supporting information · Fig. S3a
Co-HITP (DMF) XRD peak position27.5 degFigure Axis
Rounded Reported
S-7 · Supporting information · Fig. S3a
Co-HITP (DMF) XRD peak position4.7 degFigure Axis
Rounded Reported
S-7 · Supporting information · Fig. S3a
Co-HITP (DMF) XRD peak position9.5 degFigure Axis
Rounded Reported
S-7 · Supporting information · Fig. S3a
Co-HITP (water) film formationwithout thin film; noisy/featureless XRD trace relative to Co-HITP (DMF)Figure Axis
Qualitative
S-7 · Supporting information · Fig. S3d-f