HR-TEM
Ni3(HITP)2 film-3 min · Thin Film
FEI Talos F200S TEM at 200 kV.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HR-TEM lattice fringe spacing | ~1.8 nm | — | — | Text Approximate | p004-p005 / 2378-2379 · Results and discussion · Fig. 3c |