Microscopy Morphology — Conductive Ni3(HITP)2 nanofilm with asymmetrical morphology prepared by gas–liquid interface self-assembly for glucose sensing

4 measurement groups · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Ni3(HITP)2 film-3 min · Thin Film

EDS mapping for C, N, and Ni element distribution on film surface.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
EDS elemental distribution	C, N and Ni evenly distributed on film surface	—	—	Qualitative Qualitative	p003 / 2377 · Results and discussion · Fig. S3

DS-Ni-HITP-3 min · Thin Film

SEM at 15 kV; AFM in tapping mode for down-side surface of 3 min film.

Geometry: thin film surface
Context: pristine Ni3(HITP)2 film surface
Measurement source: p003-p004 / 2377-2378 · Results and discussion · Fig. 2b,d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Down-side surface roughness Ra	Ra = 52.2 nm	—	—	Text Exact Reported	p003-p004 / 2377-2378 · Results and discussion · Fig. 2d

US-Ni-HITP-3 min · Thin Film

SEM at 15 kV; AFM in tapping mode for up-side surface of 3 min film.

Geometry: thin film surface
Context: pristine Ni3(HITP)2 film surface
Measurement source: p003-p004 / 2377-2378 · Results and discussion · Fig. 2a,c

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Up-side surface roughness Ra	Ra = 5.01 nm	—	—	Text Exact Reported	p003-p004 / 2377-2378 · Results and discussion · Fig. 2c

Ni3(HITP)2 thin film · Thin Film

Thickness and roughness compared for films grown 1, 3, and 5 min.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Film thickness after 1 min	~10 nm	—	—	Text Approximate	p003 / 2377 · Results and discussion · Fig. S2
Film thickness after 3 min	~20 nm	—	—	Text Approximate	p003 / 2377 · Results and discussion · Fig. S2
Film thickness after 5 min	~100 nm	—	—	Text Approximate	p003 / 2377 · Results and discussion · Fig. S2
US-Ni-HITP roughness after 1 min	~2.5 nm	—	—	Text Approximate	p003 / 2377 · Results and discussion · Fig. S2
US-Ni-HITP roughness after 5 min	~52.2 nm	—	—	Text Approximate	p003 / 2377 · Results and discussion · Fig. S2