Spectroscopy — Conductive Ni3(HITP)2 nanofilm with asymmetrical morphology prepared by gas–liquid interface self-assembly for glucose sensing

5 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Ni3(HITP)2 film-3 min · Thin Film

FT-IR comparison of Ni3(HITP)2 powder and film.

Geometry: film and powder comparison
Context: pristine Ni3(HITP)2 film
Measurement source: p002 and p004-p005 / 2376-2379 · Characterizations; Results and discussion · Fig. 3d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
FT-IR film/powder peak correspondence	peaks' positions of powder and film correspond, indicating as-prepared film is Ni3(HITP)2	—	—	Qualitative Qualitative	p004-p005 / 2378-2379 · Results and discussion · Fig. 3d

Ni3(HITP)2 powder reference · Powder

Powder reference spectrum compared against Ni3(HITP)2 film spectrum.

Geometry: powder reference
Context: pristine Ni3(HITP)2 powder reference
Measurement source: p004-p005 / 2378-2379 · Results and discussion · Fig. 3d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source

DS-Ni-HITP-3 min · Thin Film

Raman D/G ratio comparison of US-Ni-HITP and DS-Ni-HITP films.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
D/G ratio for DS-Ni-HITPMarked as a best value within this paper	D:G = 1.08	—	—	Visual Estimate Approximate	p008 / 2382 · Results and discussion · Fig. 6b
D/G ratio for US-Ni-HITP	D:G = 1.05	—	—	Visual Estimate Approximate	p008 / 2382 · Results and discussion · Fig. 6b

DS-Ni-HITP-3 min · Thin Film

Thermo Scientific K-Alpha, Al Kalpha X-rays, hv = 1486.6 eV, 12 kV, 6 mA.

Geometry: thin film surface
Context: pristine Ni3(HITP)2 down-side film
Measurement source: p002 and p008 / 2376 and 2382 · Characterizations; Results and discussion · Fig. 6a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Defective unsaturated Ni fraction in DS-Ni-HITPMarked as a best value within this paper	48.49%	—	—	Text Exact Reported	p008 / 2382 · Results and discussion · Fig. 6a
Unsaturated defective Ni binding energy	856.7 eV	—	—	Text Exact Reported	p007-p008 / 2381-2382 · Results and discussion · Fig. 6a
Saturated coordinative Ni binding energy	855.2 eV	—	—	Text Exact Reported	p007-p008 / 2381-2382 · Results and discussion · Fig. 6a

US-Ni-HITP-3 min · Thin Film

Thermo Scientific K-Alpha, Al Kalpha X-rays, hv = 1486.6 eV, 12 kV, 6 mA.

Geometry: thin film surface
Context: pristine Ni3(HITP)2 up-side film
Measurement source: p002 and p008 / 2376 and 2382 · Characterizations; Results and discussion · Fig. 6a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Defective unsaturated Ni fraction in US-Ni-HITP	11.25%	—	—	Text Exact Reported	p008 / 2382 · Results and discussion · Fig. 6a