AFM of C10-DNTT semiconductor morphology
PM1-based NeuVS OFET · Electrode
AFM images of C10-DNTT grown on PAA, PM1, and PM2 dielectric layers; roughness labels read from SI rendered Figure S7.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| C10-DNTT on PAA roughness Rq | Rq=10.9 nm | — | — | Figure Axis Rounded Reported | 8 · Supporting Information · Figure S7 |
| C10-DNTT on PM1 roughness RqMarked as a best value within this paper | Rq=9.89 nm | — | — | Figure Axis Rounded Reported | 8 · Supporting Information · Figure S7 |
| C10-DNTT on PM2 roughness Rq | Rq=10.4 nm | — | — | Figure Axis Rounded Reported | 8 · Supporting Information · Figure S7 |