Microscopy Morphology — Metal–Organic Frameworks Coordination-Oriented Polymer Dielectrics for Neuromorphic Vision Sensors

Measurement evidence

Microscopy Morphology

Metal–Organic Frameworks Coordination-Oriented Polymer Dielectrics for Neuromorphic Vision Sensors · Zhu D., Du J., Peng Z. et al. · SmartMat · 2025 · e1322

3 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

AFM of C10-DNTT semiconductor morphology

PM1-based NeuVS OFET · Electrode

AFM images of C10-DNTT grown on PAA, PM1, and PM2 dielectric layers; roughness labels read from SI rendered Figure S7.

Atmosphere
atmospheric conditions for AFM
Geometry
C10-DNTT on dielectric films
Context
PAA control vs PM1/PM2 composite dielectrics
Measurement source
8 · Supporting Information · Figure S7
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
C10-DNTT on PAA roughness RqRq=10.9 nmFigure Axis
Rounded Reported
8 · Supporting Information · Figure S7
C10-DNTT on PM1 roughness RqMarked as a best value within this paperRq=9.89 nmFigure Axis
Rounded Reported
8 · Supporting Information · Figure S7
C10-DNTT on PM2 roughness RqRq=10.4 nmFigure Axis
Rounded Reported
8 · Supporting Information · Figure S7

SEM and AFM

PM1 (PAA-MOF-1) dielectric film · Thin Film

Surface morphologies of PAA, PM1, and PM2 films in horizontal and tilted 45-degree states; AFM surface roughness.

Atmosphere
atmospheric conditions for AFM
Geometry
dielectric film on ITO/glass
Context
PAA pristine control and PM1/PM2 composites
Measurement source
4 · 3.1 · Supporting Information Figure S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PAA surface roughness0.53Text
Exact Reported
4 · 3.1 · Supporting Information Figure S3
PM1 surface roughness0.47Text
Exact Reported
4 · 3.1 · Supporting Information Figure S3
PM2 surface roughnessMarked as a best value within this paper0.43Text
Exact Reported
4 · 3.1 · Supporting Information Figure S3

SEM and TEM

Zr-BTB nanosheets · Nanosheet

Morphology of Zr-BTB and dielectric layers recorded by high-resolution field-emission SEM and field-emission TEM.

Context
Pristine MOF component
Measurement source
2,4 · 2.2 Device Characterization; 3.1 · Supporting Information Figure S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Zr-BTB nanosheet thickness~3 nm~Text
Approximate
4 · 3.1 · Supporting Information Figure S1