Spectroscopy — Conductive metal-organic framework synthesis from metal nanoparticle precursors

5 measurement groups · 19 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu3(HITP)2 on Pt/glass interdigitated electrodes · Electrode

500-2500 cm-1 scan range, 40 s acquisition; Cu and Ni MOFs on glass IDEs compared with HATP ligand.

Geometry: films on glass/Pt IDE
Context: pristine MOF on device substrate
Measurement source: p005-p006 · Characterisation techniques; Results · Figure 3c

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(HITP)2 Raman peak	1138 cm-1	—	—	Figure Axis Rounded Reported	p006 · Results and discussion · Figure 3c
Cu3(HITP)2 Raman peak	1391 cm-1	—	—	Figure Axis Rounded Reported	p006 · Results and discussion · Figure 3c
Cu3(HITP)2 Raman peak	1445 cm-1	—	—	Figure Axis Rounded Reported	p006 · Results and discussion · Figure 3c
Cu3(HITP)2 Raman peak	1597 cm-1	—	—	Figure Axis Rounded Reported	p006 · Results and discussion · Figure 3c
Raman evidence for chemical transformation	MOF spectra contain peaks absent from HATP ligand spectrum	—	—	Text Qualitative	p006 · Results and discussion · Figure 3c
Ni3(HITP)2 Raman labelled feature	1507 cm-1	—	—	Figure Axis Rounded Reported	p006 · Results and discussion · Figure 3c

Cu3(HITP)2 on Pt/glass interdigitated electrodes · Electrode

MOF still adhered to glass IDE substrate; K-alpha Thermo Scientific instrument.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu MOF expected elements in XPS survey	Cu, O, N and C peaks present; residual S peaks starred	—	—	Caption Qualitative	p006 · Results and discussion · Figure 3a

Cu3(HITP)2 on Pt/glass interdigitated electrodes · Electrode

Cu3(HITP)2 samples on glass IDE, fabric, Au/mica and paper; SI compares substrate-dependent Cu oxidation states.

Geometry: supported MOF films
Context: pristine MOF on several substrates
Measurement source: p010-p013 · Cu 2p XPS scans on different substrates · Figures S10-S13

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu 2p1/2 binding energy on glass IDE	952.4 eV	—	—	Text Exact Reported	p010 · Cu 2p XPS scans · Figure S10
Cu 2p3/2 binding energy on glass IDE	932.6 eV	—	—	Text Exact Reported	p010 · Cu 2p XPS scans · Figure S10
Cu oxidation-state assignment on fabric	Cu2+ oxidation state dominant	—	—	Text Qualitative	p011 · Cu 2p XPS scans · Figure S11
Cu oxidation-state assignment on glass IDE	Cu+ favoured; Cu2+ shoulders present; metallic Cu cannot be ruled out	—	—	Text Qualitative	p010 · Cu 2p XPS scans · Figure S10
Cu oxidation-state assignment on Au/mica	MOF contains both Cu+ and Cu2+ ions	—	—	Text Qualitative	p012 · Cu 2p XPS scans · Figure S12
Cu oxidation-state assignment on paper	mainly Cu+ ions with some oxidised Cu indicated by 2p3/2 satellite	—	—	Text Qualitative	p013 · Cu 2p XPS scans · Figure S13

Ni3(HITP)2 on Pt/glass interdigitated electrodes · Electrode

MOF still adhered to glass IDE substrate; K-alpha Thermo Scientific instrument.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ni MOF expected elements in XPS survey	Ni, O, N and C peaks present; residual S peaks starred	—	—	Caption Qualitative	p006 · Results and discussion · Figure 3b

Ni3(HITP)2 on Pt/glass interdigitated electrodes · Electrode

Ni3(HITP)2 samples on glass IDE, fabric and paper; SI compares binding energies to elemental Ni.

Geometry: supported MOF films
Context: pristine MOF on several substrates
Measurement source: p016-p017 · Ni 2p XPS scans on different substrates · Figures S17-S19

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ni 2p3/2 lower bound across substrates	>855.5 eV	—	—	Text Range	p006 · Results and discussion · Figures S17-S19
Ni 2p3/2 binding energy on fabric	855.6 eV	—	—	Caption Exact Reported	p016 · Ni 2p XPS scans · Figure S18
Ni 2p3/2 binding energy on glass IDE	855.7 eV	—	—	Caption Exact Reported	p016 · Ni 2p XPS scans · Figure S17
Ni 2p3/2 binding energy on paper	855.6 eV	—	—	Caption Exact Reported	p017 · Ni 2p XPS scans · Figure S19
metallic Ni absence in XPS sampling depth	no metallic Ni within top 5 nm layer of the MOF	—	—	Text Qualitative	p017 · Ni 2p XPS scans · Figures S17-S19