Temperature-dependent resistivity and Arrhenius conductivity fitting
p-a-Cu-HHTP MOF film on electrospun nanofibres · Thin Film
Resistivity measured at different temperatures; ln(sigma/sigma300K) fitted to extended-state, tailed-state, and short-range hopping components.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Extended-state activation energy DeltaE1 | 0.1 eV | — | — | Text Rounded Reported | p005 · Results and Discussion · Figure 3d |
| Extended-state conductivity temperature range | 300-360 K | — | — | Text Range | p005 · Results and Discussion · Figure 3d |
| Short-range hopping activation energy DeltaE3 | 0.01 eV | — | — | Text Rounded Reported | p005 · Results and Discussion · Figure 3d |
| Normalised resistivity at about 360 K | rho/rho300K about 0.74 at about 360 K | 0.74 rho/rho300K | — | Figure Axis Approximate | p004 · Results and Discussion · Figure 3c |
| Temperature-dependent resistivity trend | Resistivity decreases as temperature increases | — | — | Text Qualitative | p004 · Results and Discussion · Figure 3c |
| Tailed-state activation energy DeltaE2 | 0.05 eV | — | — | Text Rounded Reported | p005 · Results and Discussion · Figure 3d |