Diffraction Structure — Self-Powered Infrared Photodetectors with Ultra-High Speed and Detectivity Based on Amorphous Cu-Based MOF Films

Measurement evidence

Diffraction Structure

Self-Powered Infrared Photodetectors with Ultra-High Speed and Detectivity Based on Amorphous Cu-Based MOF Films · Gao S., Huang Y., Tan J. et al. · ACS Applied Materials and Interfaces · 2023 · 32637-32646

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

XRD and selected-area electron diffraction (SAED)

X-ray diffraction and scattering Electron diffraction

p-a-Cu-HHTP MOF film on electrospun nanofibres · Thin Film

Phase/crystallinity assessment of p-a-Cu-HHTP MOF film.

Context: pristine MOF film
Measurement source: p002 · Results and Discussion · Figure 1f

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Amorphous phase assignment	Broad SAED diffraction rings and no crystalline XRD peaks	—	—	Text Qualitative	p003 · Results and Discussion · Figure 1f