SEM, TEM, EDS mapping, and XRD
X-ray diffraction and scatteringScanning electron microscopyTransmission electron microscopyElemental microanalysis and mapping
Ni3(HITP)2@PDA nanoparticles · Powder
Morphology and structural-retention comparison of pristine Ni3(HITP)2 and PDA-coated Ni3(HITP)2@PDA.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PDA coating observed by microscopy | conformal PDA coating on the MOF surface with preserved structural integrity | — | — | Text Qualitative | 2022 · 3.3 Characterization of conductive MOF · Fig. 2d-e |
| XRD retained crystallinity after PDA coating | retained crystallinity of the MOF framework post-modification | — | — | Text Qualitative | 2022 · 3.3 Characterization of conductive MOF · Fig. 2g |