Cross-sectional SEM and AFM
IC-CuTHPP thin-film sensor on ITO interdigital electrode · Electrode
SEM image of CuTHPP device cross-section; AFM images of thickness-controlled CuTHPP films.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| CuTHPP thin-film thickness lower member | 100 nm | — | — | Caption Rounded Reported | SI p.5 · Supporting Information · Fig. S3 |
| CuTHPP thin-film thickness middle member | 200 nm | — | — | Caption Rounded Reported | SI p.5 · Supporting Information · Fig. S3 |
| CuTHPP thin-film thickness upper member | 400 nm | — | — | Caption Rounded Reported | SI p.5 · Supporting Information · Fig. S3 |