Diffraction Structure — Tuning the Structure-Property Relationships of Metallophthalocyanine-Based Two-Dimensional Conductive Metal-Organic Frameworks with Different Metal Linkages

Measurement evidence

Diffraction Structure

Tuning the Structure-Property Relationships of Metallophthalocyanine-Based Two-Dimensional Conductive Metal-Organic Frameworks with Different Metal Linkages · Noh H.-J., Cline E., Pennington D.L. et al. · Journal of the American Chemical Society · 2025 · 8240-8249

3 measurement groups · 18 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction with Pawley refinement

CuPc-O-Cu black powder · Powder

Rigaku MiniFlex Cu Kalpha, 2theta 3-40 deg, scan rate 1 deg min-1; compared to simulated stacking models.

Context
pristine
Measurement source
main p.4; SI p.22 · Section S3 PXRD measurements · Figure 2; Figure S8
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
(001) PXRD peak position2theta = 28.26 degText
Exact Reported
main p.4 · Results and Discussion · Figure 2
interlayer distance0.316 nmText
Exact Reported
main p.4 · Results and Discussion · Figure 2
Pawley residual RpRp = 1.18%Text
Exact Reported
SI p.22 · Section S3 PXRD measurements · Figure 2; Figure S8
interlayer stacking assignmenteclipsed AA stackingText
Qualitative
main p.4; SI p.22 · Results and Discussion · Figure 2; Figure S8
Pawley-refined unit cellP4/mmm; a=b=17.508 A, c=3.16 AText
Exact Reported
SI p.22 · Section S3 PXRD measurements · Figure 2; Figure S8
Pawley weighted residual wRpwRp = 1.86%Text
Exact Reported
SI p.22 · Section S3 PXRD measurements · Figure 2; Figure S8

Powder X-ray diffraction with Pawley refinement

CuPc-O-Ni black powder · Powder

Rigaku MiniFlex Cu Kalpha, 2theta 3-40 deg, scan rate 1 deg min-1; compared to simulated stacking models.

Context
pristine
Measurement source
main p.4; SI p.21 · Section S3 PXRD measurements · Figure 2; Figure S7
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
(001) PXRD peak position2theta = 27.42 degText
Exact Reported
main p.4 · Results and Discussion · Figure 2
interlayer distance0.325 nmText
Exact Reported
main p.4 · Results and Discussion · Figure 2
Pawley residual RpRp = 1.78%Text
Exact Reported
SI p.21 · Section S3 PXRD measurements · Figure 2; Figure S7
interlayer stacking assignmenteclipsed AA stackingText
Qualitative
main p.4; SI p.21 · Results and Discussion · Figure 2; Figure S7
Pawley-refined unit cellP4/mmm; a=b=17.661 A, c=3.25 AText
Exact Reported
SI p.21 · Section S3 PXRD measurements · Figure 2; Figure S7
Pawley weighted residual wRpwRp = 2.54%Text
Exact Reported
SI p.21 · Section S3 PXRD measurements · Figure 2; Figure S7

Powder X-ray diffraction with Pawley refinement

CuPc-O-Zn black powder · Powder

Rigaku MiniFlex Cu Kalpha, 2theta 3-40 deg, scan rate 1 deg min-1; compared to simulated stacking models.

Context
pristine
Measurement source
main p.4; SI p.23 · Section S3 PXRD measurements · Figure 2; Figure S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
(001) PXRD peak position2theta = 27.52 degText
Exact Reported
main p.4 · Results and Discussion · Figure 2
interlayer distance0.324 nmText
Exact Reported
main p.4 · Results and Discussion · Figure 2
Pawley residual RpRp = 1.92%Text
Exact Reported
SI p.23 · Section S3 PXRD measurements · Figure 2; Figure S9
interlayer stacking assignmentinclined AA stackingText
Qualitative
main p.4; SI p.23 · Results and Discussion · Figure 2; Figure S9
Pawley-refined unit cella=b=17.518 A, c=3.24 A, alpha=beta=84 deg, gamma=90 degText
Exact Reported
SI p.23 · Section S3 PXRD measurements · Figure 2; Figure S9
Pawley weighted residual wRpwRp = 4.07%Text
Exact Reported
SI p.23 · Section S3 PXRD measurements · Figure 2; Figure S9