Diffraction Structure — Cu─X Bonds Regulated Conduction and Polarization Loss in Conductive Metal-Organic Framework Under Electromagnetic Field

Measurement evidence

Diffraction Structure

Cu─X Bonds Regulated Conduction and Polarization Loss in Conductive Metal-Organic Framework Under Electromagnetic Field · Cheng S., Zhou Q., Sheng D. et al. · Advanced Science · 2025 · e08379

3 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction (PXRD)

As-synthesised Cu3(HHTP)2 powder · Powder

Cu-Kalpha radiation; 2theta range 2-50 degrees.

Geometry
powder diffraction
Context
pristine framework powder
Measurement source
SI · Section 2 · Figure S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
interlayer spacingca. 3.2 AText
Approximate
SI · Section 2 · Figure S5
PXRD principal peaks2theta = 4.7°, 9.6°, 12.5° for (100), (200), (210); 27.6° for (001)Text
Rounded Reported
SI · Section 2 · Figure S5

Powder X-ray diffraction (PXRD)

As-synthesised Cu3(HITP)2 powder · Powder

Cu-Kalpha radiation; 2theta range 2-50 degrees.

Geometry
powder diffraction
Context
pristine framework powder
Measurement source
SI · Section 2 · Figure S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
interlayer spacingca. 3.2 AText
Approximate
SI · Section 2 · Figure S5
PXRD principal peaks2theta = 4.7°, 9.6°, 12.5° for (100), (200), (210); 27.6° for (001)Text
Rounded Reported
SI · Section 2 · Figure S5

Powder X-ray diffraction (PXRD)

As-synthesised Cu3(THT)2 powder · Powder

Cu-Kalpha radiation; 2theta range 2-50 degrees.

Geometry
powder diffraction
Context
pristine framework powder
Measurement source
SI · Section 2 · Figure S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
interlayer spacing3.5 AText
Rounded Reported
SI · Section 2 · Figure S5
PXRD principal peaks2theta = 5.3°, 6.33°, 12.75°Text
Rounded Reported
SI · Section 2 · Figure S5