Measurement evidence
Cu─X Bonds Regulated Conduction and Polarization Loss in Conductive Metal-Organic Framework Under Electromagnetic Field · Cheng S., Zhou Q., Sheng D. et al. · Advanced Science · 2025 · e08379
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
As-synthesised Cu3(HHTP)2 powder · Powder
SEM SU-70; HR-TEM JEM 2100F; EDS elemental analyses.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDX elemental statistics summary | C 67.34, O 16.60, Cu 16.06 wt%; C 81.29, O 15.04, Cu 3.67 atom% | — | — | Figure Axis Rounded Reported | 7 · Section 1 · Figure S4 |
| morphology | nano-hexagonal prism; micrometre-level length | — | — | Text Qualitative | 2 · Section 2.1 · Figure 2; Figure S2 |
As-synthesised Cu3(HITP)2 powder · Powder
SEM SU-70; HR-TEM JEM 2100F; EDS elemental analyses.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDX elemental statistics summary | C 74.95, O 3.93, N 10.75, Cu 10.36 wt%; C 84.14, O 3.32, N 10.35, Cu 2.20 atom% | — | — | Figure Axis Rounded Reported | 7 · Section 1 · Figure S4 |
| morphology | nano-hexagonal prism; micrometre-level length | — | — | Text Qualitative | 2 · Section 2.1 · Figure 2; Figure S2 |
As-synthesised Cu3(THT)2 powder · Powder
SEM SU-70; HR-TEM JEM 2100F; EDS elemental analyses.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDX elemental statistics summary | C 46.42, O 2.26, S 23.93, Cu 27.39 wt%; C 74.56, O 2.73, S 14.40, Cu 8.31 atom% | — | — | Figure Axis Rounded Reported | 7 · Section 1 · Figure S4 |
| morphology | nano-hexagonal prism; micrometre-level length | — | — | Text Qualitative | 2 · Section 2.1 · Figure 2; Figure S2 |