Variable-angle spectroscopic ellipsometry with anisotropic B-spline model
Evaporated HHTP thin film on silicon · Thin Film
Evaporated HHTP film on silicon; ordinary and extraordinary refractive indices fitted.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HHTP ellipsometry film thickness | 34 nm | — | — | Caption Exact Reported | S6 · Figure caption · Figure S1 |
| HHTP film molecular orientation order parameter | -0.22 | — | — | Text Exact Reported | p002 · Results and Discussion · Figure S1 |
| Reference order parameter for perfect horizontal alignment | -0.5 | — | — | Text Exact Reported | p002 · Results and Discussion |
| Reference order parameter for random orientation | 0 | — | — | Text Exact Reported | p002 · Results and Discussion |