| Cu2[PcCu-O8] local vertical c-AFM sampleresearch_0061__mat__mat_cu2_pccu_o8 | Thin Film · Target Sample · Composite | Cu2[PcCu-O8] film on silver substrate, probed by PtIr-coated AFM tip50 nm silver layer · Mean film thickness d = 19 +/- 3 nm; local effective height varied about 90-160 nm | SI p. 10-12 · Vertical transport · Schemes S6-S7 |
| Cu2[PcCu-O8] edge-on MOF filmresearch_0061__mat__mat_cu2_pccu_o8 | Thin Film · Target Sample · Pristine Framework | Air/water interfacial film transferred horizontally to substratesTransferred from water surface to h-BN, SiO2/Si, TEM grid, quartz, copper foil, silver, or device substrates depending on measurement · about 20 nm for morphology; about 100 nm for van der Pauw measurements; 20-250 nm for vertical devices | p. 3 · Design, Synthesis, and Characterization · Figures 1 and 2 |
| Cu2[PcCu-O8] local lateral h-BN/FET contact deviceresearch_0061__mat__mat_cu2_pccu_o8 | Thin Film · Target Sample · Composite | Cu2[PcCu-O8] applied on h-BN; Ti/Au contacts patterned by electron-beam lithographyHighly doped Si/300 nm SiO2 with h-BN flake · Step-height measured locally; Scheme S5 gives example positions | SI p. 9-10 · Local characterization of directional charge transport · Figure S19; Scheme S5 |
| PcCu-OH8 self-assembly on waterresearch_0061__mat__mat_pccu_oh8 | Thin Film · Unknown · Unknown | Self-assembled from PcCu-OH8 solution on water before Cu acetate/sodium acetate additionAir/water interface; transferred to substrates for OM/TEM | p. 3 · Design, Synthesis, and Characterization · Figure 1b,c; Figure S2 |
| Cu2[PcCu-O8] macroscopic van der Pauw deviceresearch_0061__mat__mat_cu2_pccu_o8 | Thin Film · Target Sample · Pristine Framework | Square van der Pauw sample; silver wires contacted using silver-conductive glue pasteInsulating substrate with silver-conductive glue contacts · about 100 nm | p. 4 · Charge Transport Properties · Figure 3a |
| Cu2[PcCu-O8] macroscopic vertical deviceresearch_0061__mat__mat_cu2_pccu_o8 | Thin Film · Target Sample · Pristine Framework | Gold contacts evaporated through shadow masks; top-bottom contact geometrySi/SiO2 vertical device stack with evaporated Au top contacts · 20-250 nm | SI p. 9 · Macroscopic vertical devices · Figure S18 |
| Cu2[PcCu-O8] monolayer DFT modelresearch_0061__mat__mat_cu2_pccu_o8_model | Model · Model System · Model | Optimised computational modelNone · Monolayer model with 10 angstrom vacuum normal to monolayer | SI p. 5 · Modeling and electronic structure · Figure 4a |
| Cu2[PcCu-O8] multilayer AA-inclined DFT modelresearch_0061__mat__mat_cu2_pccu_o8_model | Model · Model System · Model | DFT+U multilayer model with Grimme-D2 interlayer dispersionNone · 3D stacked periodic model | SI p. 5 · Modeling and electronic structure · Table S2 |
| Cu2[PcFe-O8] edge-on MOF filmresearch_0061__mat__mat_cu2_pcfe_o8 | Thin Film · Target Sample · Pristine Framework | Prepared under conditions stated to be identical to Cu2[PcCu-O8] filmTransferred film; OM/TEM/HRTEM/SAED substrates · 30 nm in Table S1 | SI p. 27 and p. 37 · Supporting Figures and Tables · Figure S14; Table S1 |
| PcFe-OH8 Langmuir film on waterresearch_0061__mat__mat_pcfe_oh8 | Thin Film · Unknown · Unknown | Compressed Langmuir film for pi-A isothermAir/water interface | SI p. 26 · Supporting Figures and Tables · Figure S13 |