SEM, OM, AFM, TEM
Cu2[PcCu-O8] edge-on MOF film · Thin Film
Films deposited on Si substrate for SEM, copper grids for TEM, 300 nm SiO2/Si for OM/AFM
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu2[PcCu-O8] crystal domain size | about 600 nm | — | — | Text Approximate | p. 2 · Introduction · Figure 1f |
| Macroscopic film area | over cm2 | — | — | Text Approximate | p. 3 · Design, Synthesis, and Characterization · Figure 1d; Figure S3 |
| Cu2[PcCu-O8] nanosheet film thickness | about 20 nm | — | — | Text Approximate | p. 2-3 · Design, Synthesis, and Characterization · Figure 1e; Figure 2a; Figure S4 |
| Cu2[PcCu-O8] Table S1 thickness | 20 nm | — | — | SI Table Exact Reported | SI p. 37 · Supporting Figures and Tables · Table S1 |