Diffraction Structure — Interfacial Synthesis of Layer-Oriented 2D Conjugated Metal-Organic Framework Films toward Directional Charge Transport

4 measurement groups · 14 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu2[PcCu-O8] edge-on MOF film · Thin Film

XRD1 beamline at ELETTRA; Dectris Pilatus 2M; photon energy 12.398 keV; incidence angle 0.13 deg; exposure 180 s

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
GIWAXS in-plane pi-pi stacking peak	1.90 A^-1	—	—	Text Exact Reported	p. 4 · Crystallinity and Molecular Orientation · Figure 2f
GIWAXS out-of-plane (100) Qz	Qz = 0.36 A^-1	—	—	Text Exact Reported	p. 4 · Crystallinity and Molecular Orientation · Figure 2f
GIWAXS out-of-plane (200) Qz	Qz = 0.72 A^-1	—	—	Text Exact Reported	p. 4 · Crystallinity and Molecular Orientation · Figure 2f
GIWAXS out-of-plane (400) Qz	Qz = 1.43 A^-1	—	—	Text Exact Reported	p. 4 · Crystallinity and Molecular Orientation · Figure 2f
Cu2[PcCu-O8] interlayer distance	about 0.33 nm	—	—	Text Approximate	p. 4 · Crystallinity and Molecular Orientation · Figure 2g
Cu2[PcCu-O8] square unit-cell a	a = 1.81 nm	—	—	Text Exact Reported	p. 4 · Crystallinity and Molecular Orientation · Figure 2g

Cu2[PcCu-O8] edge-on MOF film · Thin Film

Image-side Cs-corrected FEI Titan 80-300 at 300 kV; low-dose technique; AC-HRTEM dose rate about 200 e- A^-2 s^-1 and SAED 0.15 e- A^-2 s^-1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu2[PcCu-O8] pi-pi stacking distance by HRTEM/SAED	0.33 nm	—	—	Text Exact Reported	p. 4 · Crystallinity and Molecular Orientation · Figure 2d
Preferential interlayer pi-pi stacking angle	75 deg relative to intralayer conjugation direction	—	—	Text Exact Reported	p. 4 · Crystallinity and Molecular Orientation · Figure 2c,d
Cu2[PcCu-O8] nearest SAED reflection real-space distance	1.75 nm	—	—	Text Exact Reported	p. 4 · Crystallinity and Molecular Orientation · Figure 2a,b

PcCu-OH8 self-assembly on water · Thin Film

Self-assembled PcCu-OH8 film transferred from water surface

Atmosphere: Ambient preparation
Context: Precursor ligand assembly
Measurement source: p. 2-3 · Design, Synthesis, and Characterization · Figure 1b,c

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
PcCu-OH8 self-assembly diffuse-arc real-space distance	0.33 nm	—	—	Text Exact Reported	p. 3 · Design, Synthesis, and Characterization · Figure 1c
PcCu-OH8 self-assembly nearest real-space distance	about 1.73 nm	—	—	Text Approximate	p. 3 · Design, Synthesis, and Characterization · Figure 1c
PcCu-OH8 self-assembly nearest SAED reflection	0.58 nm^-1	—	—	Text Exact Reported	p. 3 · Design, Synthesis, and Characterization · Figure 1c

Cu2[PcFe-O8] edge-on MOF film · Thin Film

Crystal-structural characterisation of Cu2[PcFe-O8] film

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu2[PcFe-O8] pi-pi stacking distance	0.31 nm	—	—	Text Exact Reported	p. 4 · Crystallinity and Molecular Orientation · Figure S14
Cu2[PcFe-O8] Table S1 thickness	30 nm	—	—	SI Table Exact Reported	SI p. 37 · Supporting Figures and Tables · Table S1