ATR-FTIR, Raman, XPS, SEM-EDX, XANES, EXAFS, UV-vis
Infrared spectroscopyRaman spectroscopyX-ray photoelectron spectroscopyUV-visible and optical absorption spectroscopyX-ray absorption spectroscopyScanning electron microscopyElemental microanalysis and mapping
Cu2[PcCu-O8] edge-on MOF film · Thin Film
FTIR on copper foil; XPS AXIS Ultra DLD calibrated to C1s 284.6 eV; UV-vis on 3 x 3 cm quartz wafer
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu:O ratio by SEM-EDX | Cu:O = 1:2.5 | — | — | Text Exact Reported | p. 4 · Crystallinity and Molecular Orientation · Figure S7 |
| EXAFS Cu-O peak | about 1.52 A | — | — | Text Approximate | p. 4 · Crystallinity and Molecular Orientation · Figure S8b |
| OH mode disappearance by ATR-FTIR | OH modes around 3200 cm^-1 vanish | — | — | Text Qualitative | p. 4 · Crystallinity and Molecular Orientation · Figure S5a |
| Optical band gap by UV-vis/Tauc | about 1.17 eV | — | — | Text Approximate | SI p. 22 · Supporting Figures and Tables · Figure S9 |
| Cu:O ratio by XPS | Cu:O = 1:2.6 | — | — | Text Exact Reported | p. 4 · Crystallinity and Molecular Orientation · Figure S6 |