Primary studyCore evidenceThermoelectric

Tunable Carrier Type of a Semiconducting 2D Metal-Organic Framework Cu3(HHTP)2

De Lourdes Gonzalez-Juarez M., Morales C., Flege J.I. et al. · ACS Applied Materials and Interfaces · 2022 · 12404-12411

1materials
5samples
5synthesis routes
16measurements
55results
6claims and caveats

Evidence map

Open a family to keep every result attached to its sample, method and conditions.

Author interpretations and caveats

Paraphrased for this database from the authors’ stated interpretations — never quoted verbatim — and kept separate from reported measurements.

CaveatSupport assessment: High

CuHHTP-70 is less stable under X-ray exposure than CuHHTP-40, with Cu(I) becoming dominant after repeated XPS scans.

Caveat: This is an XPS beam exposure stability caveat and not necessarily a storage stability measurement.

main p.6, article p.12409 · Charge Transport Properties · Figure 5 · Linked to 4 structured results

Composite RoleSupport assessment: Medium

Residual PMMA on transferred MOF films, especially CuHHTP-70, is proposed to passivate the surface, act as an electron trap, and hinder charge transport.

Caveat: Attribution is inferential from morphology, conductivity and literature on PMMA residues.

main p.5, article p.12408 · Charge Transport Properties · Figure 3d · Linked to 3 structured results

Phase AssignmentSupport assessment: High

PMMA transfer does not compromise the crystalline Cu3(HHTP)2 phase, based on retained GIXRD MOF peaks.

Caveat: GIXRD also shows an amorphous polymer contribution from the support.

main p.3, article p.12406 · Results and Discussion · Figure 2 · Linked to 5 structured results

Structure Property LinkSupport assessment: Medium

Using PAA/methanol instead of PMMA/chlorobenzene still gives a 40 C n-type and 70 C p-type trend, suggesting the carrier-type switch is not restricted to PMMA.

Caveat: PAA data are supporting-information comparative data; detailed methods and morphology are less extensive than for PMMA samples.

main p.6, article p.12409 · Charge Transport Properties · Figure S6; Table S2 · Linked to 5 structured results

Transport MechanismSupport assessment: High

Drying/transferring electrodeposited Cu3(HHTP)2 films at the higher temperature switches the majority carrier type from n-type in CuHHTP-40 to p-type in CuHHTP-70.

Caveat: The films are polymer-supported after transfer, so residual polymer and adsorbed oxygen/water are part of the experimental context.

main p.1, article p.12404 · Abstract · Linked to 6 structured results

Transport MechanismSupport assessment: Medium

The authors attribute p-type conduction most likely to molecular oxygen/water adsorption acting as an electron acceptor and causing hole doping.

Caveat: The paper frames this as likely and notes further molecular dynamics and band-structure calculations are ongoing.

main p.6, article p.12409 · Charge Transport Properties · Linked to 4 structured results

Material identities

Names and aliases are kept exactly within the paper’s own identity model.

MaterialCompositionStructure contextSource
Cu3(HHTP)2 two-dimensional metal-organic frameworkBrowse family: Cu₃(HHTP)₂ / Cu–HHTPCu3C36H18O12; abbreviated Cu3(HHTP)2Cu ions coordinated to HHTP ligands; Cu(II)/Cu(I) ratios probed by Cu 2p XPS. · 2,3,6,7,10,11-hexahydroxytriphenylene (HHTP)2D · PristineExtended two-dimensional sheets stacked along the crystallographic c direction; AA-packed sheets with ca. 18 A pores and ca. 3.3 A interlayer spacing.main p.2, article p.12405 · Introduction · Figure 1

Sample register

Sample form, processing state and composition status define the context for measurements.

Show 5 sample records
SampleForm and roleProcessing and geometrySource
As-electrodeposited Cu3(HHTP)2 thin film on Au/SiO2research_0078__mat__cu3_hhtp2Thin Film · Pristine Control · Pristine FrameworkPristine electrodeposited MOF film before polymer transfer.Au/SiO2 substrate, prepared by electrodepositing Cu on Au/SiO2 followed by anodic dissolution in HHTP solution. · ca. 5 um from SEM cross-sectionmain p.3, article p.12406 · Results and Discussion · Figures 2, 3; Figure S1
CuHHTP-PAA-40 PAA-transferred Cu3(HHTP)2 filmresearch_0078__mat__cu3_hhtp2Thin Film · Composite Sample · CompositePAA/MeOH drop-cast onto electrodeposited Cu3(HHTP)2 and dried at 40 C before transfer.PAA support after transfer from electrodeposited film. · Transferred film thickness not quantified.SI p.S7 · Cu3(HHTP)2 thin films transferred with PAA · Figure S5
CuHHTP-PAA-70 PAA-transferred Cu3(HHTP)2 filmresearch_0078__mat__cu3_hhtp2Thin Film · Composite Sample · CompositePAA/MeOH drop-cast onto electrodeposited Cu3(HHTP)2 and dried at 70 C before transfer.PAA support after transfer from electrodeposited film. · Transferred film thickness not quantified.SI p.S7 · Cu3(HHTP)2 thin films transferred with PAA · Figure S5
CuHHTP-40 PMMA-transferred Cu3(HHTP)2 filmresearch_0078__mat__cu3_hhtp2Thin Film · Composite Sample · CompositePMMA suspension drop-cast onto Cu3(HHTP)2/Au/SiO2, dried at 40 C overnight, peeled off and characterised.PMMA support after peeling from Au/SiO2; for XPS supported on Si with native oxide using UHV-compatible carbon tape. · Parent electrodeposited film ca. 5 um; transferred thickness not separately reported.main p.3, article p.12406 · Results and Discussion · Figure 2
CuHHTP-70 PMMA-transferred Cu3(HHTP)2 filmresearch_0078__mat__cu3_hhtp2Thin Film · Composite Sample · CompositePMMA suspension drop-cast onto Cu3(HHTP)2/Au/SiO2, dried at 70 C overnight, peeled off and characterised.PMMA support after peeling from Au/SiO2; for XPS supported on Si with native oxide using UHV-compatible carbon tape. · Parent electrodeposited film ca. 5 um; transferred thickness not separately reported.main p.3, article p.12406 · Results and Discussion · Figure 2